AC Test Circuit
Test Configuration Component Values
Test Configuration
V
CC
C
L
(pF)
50
50
R1
(Ω)
990
580
R2
(Ω)
770
390
3.3V Standard Test
5V Standard Test
R1
Device
Under
Test
C
L
R2
O
UT
NOTES:
C
L
includes jig capacitance.
Parameter
Input Pulse Level
Input Rise and Fall
Input and Output Timing Reference Level
Typical
0 – 3.0
5
1.5
Units
V
nS
V
AC Waveforms for Write and Erase Operations, WE Controlled
V
CC
Power-up
Standby
V
IH
Write
Write Program or
Valid Address & Data (Program)
Erase Setup Command
or Erase Confirm Command
Automated Program
or Erase Delay
Read Status
Register Data
Write Read Array
Command
Addresses
V
IL
A
IN
A
IN
t
AVAV
V
IH
t
AVWH
t
WHAX
CE
V
IL
t
ELWL
t
WHEH
V
IH
OE
V
IL
t
WHWL
V
IH
t
WHQV1,2,3,4
WE
V
IL
t
WLWH
t
WHDX
t
DVWH
V
IH
Data
V
IL
High Z
t
PHWL
D
IN
D
IN
Valid
SRD
D
IN
t
PHHWH
V
HH
t
QVPH
6.5V
V
IH
RP
V
IL
V
IH
WP
V
IL
t
VPWH
V
PPH
2
V
PPH
1
V
PPLK
V
IL
t
QVVL
V
PP
Aeroflex Circuit Technology
6
SCD1661B REV A 1/16/97 Plainview NY (516) 694-6700
AEROFLEX [ AEROFLEX CIRCUIT TECHNOLOGY ]
