AIC431/TL431A/TL431
n
TEST CIRCUITS
IN
IN
I
L
R1
I
L
V
Z
AIC431
I
Z
V
Z
I
REF
I
Z
V
REF
AIC431
R2
I
REF
V
REF
Note: V
Z
=V
REF
(1+R1/R2)+I
REF
xR1
Fig. 1 Test Circuit for V
Z
=V
REF
Fig. 2 Test circuit for V
Z
>V
REF
IN
V
Z
AIC431
I
Z(OFF)
Fig. 3 Test circuit for off-state Current
n
ELECTRICAL CHARACTERISTICS
(Ta=25°C, unless otherwise specified.)
PARAMETER
TEST CONDITIONS
V
Z
=V
REF
,
Reference Voltage
IL =10mA (Fig. 1)
AIC431
TL431A
TL431
Deviation of Reference
Input Voltage Over
Temperature
(Note 3)
Ratio of the Change in Refer-
ence Voltage to
the Change in Cathode volt-
age
Reference Input Current
V
Z
= V
REF
, I
L
=10mA,
Ta = 0°C~ +85°C (Fig. 1)
I
Z
=10mA
(Fig. 2)
∆V
Z
=10V-V
REF
∆V
Z
=30V-10V
V
DEV
9.0
20
mV
V
REF
SYMBOL
MIN.
2.482
2.470
2.455
TYP.
2.495
2.495
2.495
MAX.
2.508
2.520
2.535
UNIT
V
∆V
REF
∆V
Z
I
REF
-0.5
-0.35
0.8
-2.0
-1.5
3.5
mV/V
mV/V
µA
R1 =10KΩ, R2=∞,
I
L
=10mA (Fig. 2)
3
AIC [ ANALOG INTERGRATIONS CORPORATION ]
