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AT5510 参数 Datasheet PDF下载

AT5510图片预览
型号: AT5510
PDF下载: 下载PDF文件 查看货源
内容描述: 120毫安,吸收电流, 10位I2C DAC用于VCM驱动器 [120mA, Current Sinking, 10-bit I2C DAC for VCM Driver]
分类和应用: 驱动器
文件页数/大小: 12 页 / 208 K
品牌: AIMTRON [ AIMTRON TECHNOLOGY ]
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AT5510
Preliminary Product Information
120mA, Current Sinking,
10-bit I
2
C DAC for VCM Driver
Terminology
Resolution
Resolution of DAC is the number of bits to present the analog output signal.
Integral nonlinearity (INL)
Integral nonlinearity is a measurement of the maximum deviation, in LSB, from a straight line
passing through the endpoints of the DAC transfer function. A typical INL vs. code plot is shown in
Figure 3.
Differential nonlinearity (DNL)
Differential nonlinearity is the difference between the measured and ideal 1 LSB change by any
two adjacent code. A typical DNL vs. code plot is shown in Figure 4.
Zero-code error
Zero-code error is a measurement of the output error when zero code (0x0000) is loaded to the
DAC register. The zero-code error is positive in AT5510.
Gain error
Gain error is a measurement of the span error of the DAC. It is the deviation in slope of the DAC
transfer characteristic from the ideal, expressed as percent of the full-scale range.
Offset error
Offset error is a measurement of the difference between actual output current (I
SINK
) and ideal
output current (Io). It is measured on the AT5510 with Code 16 loaded into the DAC register.
2F, No.10, Prosperity RD. II, Science-Based Industrial Park, Hsinchu 300,Taiwan, R.O.C.
Tel: 886-3-563-0878
Fax: 886-3-563-0879
WWW:
http://www.aimtron.com.tw
9/20/2007 REV:0.2
Email:
service@aimtron.com.tw
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