AS7C513
AS7C3513
®
Functional description
The AS7C513 and the AS7C3513 are high performance CMOS 524,288-bit Static Random Access Memory (SRAM) devices organized as
32,768 words × 16 bits. They are designed for memory applications where fast data access, low power, and simple interfacing are desired.
Equal address access and cycle times (tAA, tRC, tWC) of 12/15/20 ns with output enable access times (tOE) of 6,7,8 ns are ideal for high
performance applications. The chip enable input CE permits easy memory expansion with multiple-bank memory systems.
When CE is high, the devices enter standby mode. The AS7C513 and AS7C3513 are guaranteed not to exceed 28/18 mW power
consumption in CMOS standby mode. The devices also offer 2.0V data retention.
A write cycle is accomplished by asserting write enable (WE), (UB) and/or (LB), and chip enable (CE). Data on the input pins I/O0-I/O7,
and/or I/O8–I/O15, is written on the rising edge of WE (write cycle 1) or CE (write cycle 2). To avoid bus contention, external devices
should drive I/O pins only after outputs have been disabled with output enable (OE) or write enable (WE).
A read cycle is accomplished by asserting output enable (OE), (UB) and (LB), and chip enable (CE), with write enable (WE) high. The chips
drive I/O pins with the data word referenced by the input address. When either chip enable or output enable is inactive, or write enable is
active, or (UB) and (LB), output drivers stay in high-impedance mode.
The devices provide multiple center power and ground pins, and separate byte enable controls, allowing individual bytes to be written and
read. LB controls the lower bits, I/O0–I/O7, and UB controls the higher bits, I/O8–I/O15.
All chip inputs and outputs are TTL-compatible. The AS7C513 and AS7C3513 are packaged in common industry standard packages.
Absolute maximum ratings
Parameter
Device
Symbol
Vt1
Min
–0.50
–0.50
–0.50
–
Max
Unit
V
AS7C513
AS7C3513
+7.0
+5.0
VCC +0.50
1.0
Voltage on VCC relative to GND
Vt1
V
Voltage on any pin relative to GND
Power dissipation
Vt2
V
PD
W
Storage temperature (plastic)
Ambient temperature with VCC applied
DC current into outputs (low)
Tstg
–65
–55
–
+150
+125
50
o C
o C
mA
Tbias
IOUT
NOTE: Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure to
absolute maximum rating conditions for extended periods may affect reliability.
Truth table
CE
H
L
WE
OE
X
L
LB
X
L
UB
X
H
L
I/O0–I/O7
High Z
DOUT
I/O8–I/O15 Mode
X
High Z
High Z
DOUT
DOUT
DIN
Standby (ISB, ISBI
)
H
H
H
L
Read I/O0–I/O7 (ICC)
Read I/O8–I/O15 (ICC)
Read I/O0–I/O15 (ICC)
Write I/O0–I/O15 (ICC)
Write I/O0–I/O7 (ICC)
Write I/O8–I/O15 (ICC)
L
L
H
L
High Z
DOUT
L
L
L
L
X
X
X
L
L
DIN
L
L
L
H
L
DIN
High Z
DIN
L
L
H
High Z
L
L
H
X
H
X
X
H
X
H
High Z
High Z
Output disable (ICC)
Key: X = Don’t care; L = Low; H = High
3/23/01; v.1.0
Alliance Semiconductor
P. 2 of 10
ALSC [ ALLIANCE SEMICONDUCTOR CORPORATION ]
