ABSOLUTE MAXIMUM RATINGS
Storage temperature . . . . . . . . . . . . –55
°
C to +150
°
C
V
CC
with respect to AGND/DGND . . .–0.4 V to +7.0 V
V
EE
with respect to AGND/DGND . . .+0.4 V to –7.0 V
V
BAT
with respect to AGND/DGND . . +0.4 V to –70 V
Note:
Rise time of V
BAT
(dv/dt) must be limited to 27 V/µs or
less when Q
BAT
bypass = 0.33
µF.
In 32-pin PLCC package . . . . . . . . . . . . . 1.74 W
Note:
Thermal limiting circuitry on chip will shut down the
circuit at a junction temperature of about 165°C. The device
should never be exposed to this temperature. Operation
above 145°C junction temperature may degrade device
reliability. See the SLIC Packaging Considerations for more
information.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent device failure. Functionality at or above
these limits is not implied. Exposure to Absolute Maximum
Ratings for extended periods may affect device reliability.
BGND with respect to
AGND/DGND. . . . . . . . . . . . . . . .+1.0 V to –3.0 V
A(TIP) or B(RING) to BGND:
Continuous . . . . . . . . . . . . . . . . . –70 V to +1.0 V
10 ms (f = 0.1 Hz) . . . . . . . . . . . . –70 V to +5.0 V
1
µ
s (f = 0.1 Hz). . . . . . . . . . . . . . .–90 V to +10 V
250 ns (f = 0.1 Hz) . . . . . . . . . . . .–120 V to +15 V
Current from A(TIP) or B(RING). . . . . . . . . .
±
150 mA
Voltage on RINGOUT . . . BGND to 70 V above Q
BAT
Voltage on TESTOUT . . . BGND to 70 V above Q
BAT
Current through relay drivers . . . . . . . . . . . . . . 60 mA
Voltage on ring-trip inputs (DA and DB) . . .V
BAT
to 0 V
Current into ring-trip inputs . . . . . . . . . . . . . .
±
10 mA
Peak current into regulator switch (L pin) . . . 150 mA
Switcher transient peak off voltage on L pin . . +1.0 V
C4–C1, E1, CHCLK to
AGND/DGND. . . . . . . . . . –0.4 V to (V
CC
+ 0.4 V)
Maximum power dissipation (see note) . . . T
A
= 70
°
C
OPERATING RANGES
Commercial (C) Devices
Ambient temperature . . . . . . . . . . . . . . 0
°
C to +70
°
C*
V
CC
. . . . . . . . . . . . . . . . . . . . . . . . . . 4.75 V to 5.25 V
V
EE
. . . . . . . . . . . . . . . . . . . . . . . . –4.75 V to –5.25 V
V
BAT
. . . . . . . . . . . . . . . . . . . . . . . . . . –40 V to –58 V
AGND/DGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0 V
BGND with respect to
AGND/DGND . . . . . . . . . . . –100 mV to +100 mV
Load resistance on VTX to ground . . . . . . . 10 k
Ω
min
Operating Ranges define those limits between which the
functionality of the device is guaranteed.
* Functionality of the device from 0°C to +70°C is guaranteed
by production testing. Performance from
–
40°C to +85°C is
guaranteed by characterization and periodic sampling of
production units.
SLIC Products
5
AMD [ ADVANCED MICRO DEVICES ]
