AMI Semiconductor, Inc.
Absolute Maximum Ratings
1
Item
Voltage on any pin relative to V
SS
Voltage on V
CC
Supply Relative to V
SS
Power Dissipation
Storage Temperature
Operating Temperature
Soldering Temperature and Time
Symbol
V
IN,OUT
V
CC
P
D
T
STG
T
A
T
SOLDER
N64S0818HDA/N64S0830HDA
Advance Information
Rating
–0.3 to V
CC
+0.3
–0.3 to 4.5
500
–40 to 125
-40 to +85
260
o
C, 10sec
Unit
V
V
mW
o
C
o
C
o
C
1. Stresses greater than those listed above may cause permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those indicated in the operating section of this specification is not
implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
Operating Characteristics (Over Specified Temperature Range)
Item
Supply Voltage
Supply Voltage
Input High Voltage
Input Low Voltage
Output High Voltage
Output Low Voltage
Input Leakage Current
Output Leakage Current
Read/Write Operating
Current
Symbol
V
CC
V
CC
V
IH
V
IL
V
OH
V
OL
I
LI
I
LO
I
CC1
I
CC2
I
CC3
I
OH
= -0.4mA
I
OL
= 1mA
CS = V
CC
, V
IN
= 0 to V
CC
CS = V
CC
, V
OUT
= 0 to V
CC
F = 1MHz, I
OUT
= 0
F = 10MHz, I
OUT
= 0
F = 20/25MHz, I
OUT
= 0
1.8V Device
CS = V
CC
, V
IN
= V
SS
or V
CC
3V Device
CS = V
CC
, V
IN
= V
SS
or V
CC
200
1
Test Conditions
1.8V Device
3V Device
Min.
1.7
2.3
0.7 x V
CC
–0.3
V
CC
–0.5
0.2
0.5
0.5
500
4
8/10
500
3
Typ
1
Max
1.95
3.6
V
CC
+0.3
0.3 x V
CC
Unit
V
V
V
V
V
V
µA
µA
µA
mA
mA
nA
µA
Standby Current
I
SB
1. Typical values are measured at Vcc=Vcc Typ., T
A
=25°C and are not 100% tested.
Capacitance
1
Item
Input Capacitance
I/O Capacitance
Symbol
C
IN
C
I/O
Test Condition
V
IN
= 0V, f = 1 MHz, T
A
= 25
o
C
V
IN
= 0V, f = 1 MHz, T
A
= 25
o
C
Min
Max
7
7
Unit
pF
pF
1. These parameters are verified in device characterization and are not 100% tested
3
This is a developmental specification and is subject to change without notice.
AMI [ AMI SEMICONDUCTOR ]
