APL1582
Reliability test program
Test item
SOLDERABILITY
HOLT
PCT
TST
ESD
Latch-Up
Method
MIL-STD-883D-2003
MIL-STD-883D-1005.7
JESD-22-B, A102
MIL-STD-883D-1011.9
MIL-STD-883D-3015.7
JESD 78
Description
245
°
C , 5 SEC
1000 Hrs Bias @ 125
°
C
168 Hrs, 100 % RH , 121
°
C
-65
°
C ~ 150
°
C, 200 Cycles
VHBM > 2KV, VMM > 200V
10ms , I
tr
> 100mA
Carrier Tape & Reel Dimension
t
E
Po
P
P1
D
F
W
Bo
Ao
D1
T2
Ko
J
C
A
B
T1
Application
A
330
±3
B
100
±
2
D
1.5 +0.1
B
80
±
2
D
1.5 +0.1
C
13
±
0. 5
D1
1.5± 0.25
C
13
±
0. 5
D1
1.5± 0.25
J
2
±
0.5
Po
4.0
±
0.1
J
2
±
0.5
Po
4.0
±
0.1
T1
T2
16.4 + 0.3 2.5± 0.5
-0.2
P1
2.0
±
0.1
T1
24
±
4
P1
Ao
W
16+ 0.3
- 0.1
Bo
P
8
±
0.1
Ko
E
1.75± 0.1
t
0.3±0.05
E
1.75± 0.1
t
TO-252
F
7.5
±
0.1
6.8
±
0.1 10.4± 0.1 2.5± 0.1
T2
2± 0.3
Ao
W
24 + 0.3
- 0.1
Bo
P
16
±
0.1
Ko
Application
A
380±3
TO-263
F
11.5
±
0.1
2.0
±
0.1 10.8
±
0.1 16.1± 0.1 5.2± 0.1 0.35±0.013
(mm)
Copyright
ANPEC Electronics Corp.
Rev. A.4 - Apr., 2003
12
www.anpec.com.tw
ANPEC [ ANPEC ELECTRONICS COROPRATION ]
