SWRS081A – APRIL 2009 – REVISED APRIL 2009
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16-MHz RC OSCILLATOR
Measured on Texas Instruments CC2530 EM reference design with T
A
= 25°C and VDD = 3 V, unless otherwise noted.
PARAMETER
Frequency
(1)
TEST CONDITIONS
MIN
TYP
16
±18%
±0.6%
50
MAX
UNIT
MHz
Uncalibrated frequency accuracy
Calibrated frequency accuracy
Start-up time
Initial calibration time
(2)
(1)
(2)
±1%
10
µs
µs
The calibrated 16-MHz RC oscillator frequency is the 32-MHz XTAL frequency divided by 2.
When the 16-MHz RC oscillator is enabled, it is calibrated when a switch from the 16-MHz RC oscillator to the 32-MHz crystal oscillator
is performed while SLEEPCMD.OSC_PD is set to 0.
RSSI/CCA CHARACTERISTICS
Measured on Texas Instruments CC2530 EM reference design with T
A
= 25°C and VDD = 3 V, unless otherwise noted.
PARAMETER
RSSI range
Absolute uncalibrated RSSI/CCA accuracy
RSSI/CCA offset
(1)
TEST CONDITIONS
MIN
TYP
100
±4
73
1
MAX
UNIT
dB
dB
dB
dB
Step size (LSB value)
(1)
Real RSSI = Register value – offset
FREQEST CHARACTERISTICS
Measured on Texas Instruments CC2530 EM reference design with T
A
= 25°C and VDD = 3 V, unless otherwise noted.
PARAMETER
FREQEST range
FREQEST accuracy
FREQEST offset
(1)
Step size (LSB value)
(1)
Real FREQEST = Register value – offset
TEST CONDITIONS
MIN
TYP
±250
±40
20
7.8
MAX
UNIT
kHz
kHz
kHz
kHz
FREQUENCY SYNTHESIZER CHARACTERISTICS
Measured on Texas Instruments CC2530 EM reference design with T
A
= 25°C, VDD = 3 V and f
c
= 2440 MHz, unless
otherwise noted.
PARAMETER
Phase noise, unmodulated carrier
TEST CONDITIONS
At ±1-MHz offset from carrier
At ±2-MHz offset from carrier
At ±5-MHz offset from carrier
MIN
TYP
–110
–117
–122
dBc/Hz
MAX
UNIT
ANALOG TEMPERATURE SENSOR
Measured on Texas Instruments CC2530 EM reference design with T
A
= 25°C and VDD = 3 V, unless otherwise noted.
PARAMETER
Output at 25°C
Temperature coefficient
Voltage coefficient
Initial accuracy without calibration
Accuracy using 1-point calibration (entire
temperature range)
Current consumption when enabled (ADC
current not included)
Measured using integrated ADC using
internal bandgap voltage reference and
maximum resolution
TEST CONDITIONS
MIN
TYP
1480
4.5
1
±10
±5
0.5
MAX
UNIT
12-bit ADC
/10°C
/0.1 V
°C
°C
mA
8
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