3. Memory Organization
AT24C32C/64C, 32/64K SERIAL EEPROM: The 32K/64K is internally organized as 128/256
pages of 32 bytes each. Random word addressing requires a 12/13 bit data word address.
(1)
Pin Capacitance
Applicable over recommended operating range from TA = 25°C, f = 1.0 MHz, VCC = +1.8V to 5.5V
Symbol
CI/O
Test Condition
Max
8
Units
pF
Conditions
VI/O = 0V
VIN = 0V
Input/Output Capacitance (SDA)
Input Capacitance (A0, A1, A2, SCL)
CIN
6
pF
Note:
1. This parameter is characterized and is not 100% tested.
DC Characteristics
Applicable over recommended operating range from: TAI = -40 to +85°C, VCC = +1.8 to +5.5V (unless otherwise noted)
Symbol
VCC1
ICC1
Parameter
Test Condition
Min
Typ
Max
5.5
1.0
3.0
1.0
6.0
Units
V
Supply Voltage
Supply Current
Supply Current
1.8
VCC = 5.0V
VCC = 5.0V
VCC = 1.8V
READ at 400 kHz
WRITE at 400 kHz
0.4
2.0
mA
mA
µA
ICC2
Standby Current
(1.8V option)
ISB1
VIN = VCC or VSS
VCC = 5.5V
µA
Input Leakage
Current VCC = 5.0V
ILI
V
IN = VCC or VSS
0.10
0.05
3.0
3.0
µA
µA
Output Leakage
Current VCC = 5.0V
ILO
VOUT = VCC or VSS
VIL
Input Low Level(1)
Input High Level(1)
Output Low Level
Output Low Level
−0.6
VCC x 0.3
VCC + 0.5
0.4
V
V
V
V
VIH
VCC x 0.7
VOL2
VOL1
VCC = 3.0V
VCC = 1.8V
IOL = 2.1 mA
IOL = 0.15 mA
0.2
Note:
1. VIL min and VIH max are reference only and are not tested.
4
AT24C32C/64C
5298A–SEEPR–1/08