EEPROM
Austin Semiconductor, Inc.
CAPACITANCE TABLE
1
(V
IN
= 0V, f = 1 MHz, T
A
= 25
o
C)
SYMBOL
C
ADD
C
OE
C
WE,
C
CE
C
IO
PARAMETER
A0 - A16 Capacitance
OE\, RES\, RDY Capacitance
WE\ and CE\ Capacitance
I/O 0- I/O 31 Capacitance
MAX
40
40
12
20
UNITS
pF
pF
pF
pF
AS8ER128K32
NOTE:
1. This parameter is guaranteed but not tested.
AC TEST CHARACTERISTICS
TEST SPECIFICATIONS
Input pulse levels...........................................V
SS
to 3V
Input rise and fall times...........................................5ns
Input timing reference levels.................................1.5V
Output reference levels.........................................1.5V
Output load................................................See Figure 1
NOTES:
Vz is programmable from -2V to + 7V.
I
OL
and I
OH
programmable from 0 to 16 mA.
Vz is typically the midpoint of V
OH
and V
OL
.
I
OL
and I
OH
are adjusted to simulate a typical resistive load
circuit.
Current Source
I
OL
Device
Under
Test
-
+
+
Vz = 1.5V
(Bipolar
Supply)
Ceff = 50pf
Current Source
I
OH
Figure 1
ELECTRICAL CHARACTERISTICS AND RECOMMENDED AC OPERATING CONDITIONS
(-55
o
C < T
A
< +125
o
C or -40
o
C to +85
o
C; Vcc = 5V +10%)
DESCRIPTION
Address to Output Delay
CE\ to Output Delay
OE\ to Output Delay
Address to Output Hold
CE\ or OE\ high to Output Float (1)
RES\ low to Output Float (1)
RES\ to Output Delay
TEST CONDITIONS
CE\ = OE\ = V
IL
, WE\ = V
IH
OE\ = V
IL
, WE\ = V
IH
OE\ = V
IL
, WE\ = V
IH
CE\ = OE\ = V
IL
, WE\ = V
IH
OE\ = V
IL
, WE\ = V
IH
CE\ = OE\ = V
IL
, WE\ = V
IH
CE\ = OE\ = V
IL
, WE\ = V
IH
150
SYMBOL
t
ACC
t
CE
t
OE
t
OH
t
DF
t
DFR
t
RR
10
0
0
0
0
50
350
450
MIN
MAX
150
150
75
UNITS
ns
ns
ns
ns
ns
ns
ns
AS8ER128K32
Rev. 5.3 6/05
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
4
AUSTIN [ AUSTIN SEMICONDUCTOR ]
