Specification
Oscillator type :
Issue: 01
Date: 2006-03-18
AXX3225L
Quartz Crystal Unit in SMD package 3.2x2.5 mm
Low frequency version operating in “Lame” contour mode
RoHS compliant
Parameter
Frequency range
Actual frequency f
0
Crystal cut / Vibration mode
Load capacitance C
L
Adjustment tolerance
Frequency stability
Frequency stability over temperature range
operating temperature range (steady state)
long term (aging)
Resonance resistance R
r
Motional capacitance C
1
Static capacitance C
0
Drive level
Insulation resistance
Storage temperature range
Enclosure (see drawing)
marking
min. typ. max. Unit
3
5
MHz
MHz
GT / Lame mode
10 ~ 50 pF or Series
-30
+30
+10 ~ -50
-10
+60
±5
500
150
Condition
20
200
IEC 60286-3
Packing
Notes:
1. Overall frequency stability = initial tolerance + temp. stability + aging (1
st
year)
2. Terminology and test conditions are according to IEC standard IEC60122-1, unless otherwise stated
3. Measurement technique according to IEC 60444-5 or equivalent
500
-40
+85
3.2 x 2.5 x 0.7
Frequency (MHz)
+ Date Code
Tape & Reel
ppm
ppm
ppm
°C
ppm
Ω
Ω
fF
pF
µW
MΩ
°C
@ 25°C +-5°C
Overall (Note 1)
See chart for typical f(T)
characteristic
@ 3 MHz
@ 5 MHz
100 V DC
IEC 61637
Typical Frequency vs. Temperature Characteristic
GmbH & Co. KG
Wasemweg 5
D-74821 Mosbach
Germany
AXX3225L
page
1(2)
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