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REF3012AIDBZR 参数 Datasheet PDF下载

REF3012AIDBZR图片预览
型号: REF3012AIDBZR
PDF下载: 下载PDF文件 查看货源
内容描述: 50PPM /℃ , 50uA的在SOT23-3 CMOS电压基准 [50ppm/C Max, 50UA in SOT23-3 CMOS VOLTAGE REFERENCE]
分类和应用:
文件页数/大小: 14 页 / 412 K
品牌: BURR-BROWN [ BURR-BROWN CORPORATION ]
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REF3012
REF3020
REF3025
REF3030
REF3033
REF3040
SBVS032E – MARCH 2002 – REVISED MARCH 2004
50ppm/
°
C Max, 50
µ
A in SOT23-3
CMOS VOLTAGE REFERENCE
FEATURES
q
MicroSIZE
PACKAGE: SOT23-3
q
LOW DROPOUT: 1mV
q
HIGH OUTPUT CURRENT: 25mA
q
HIGH ACCURACY: 0.2%
q
LOW I
Q
: 50
µ
A max
q
EXCELLENT SPECIFIED DRIFT PERFORMANCE:
50ppm/
°
C (max) from 0
°
C to +70
°
C
75ppm/
°
C (max) from –40
°
C to +125
°
C
DESCRIPTION
The REF30xx is a precision, low power, low voltage dropout
voltage reference family available in a tiny SOT23-3.
The REF30xx small size and low power consumption (50µA
max) make it ideal for portable and battery-powered applica-
tions. The REF30xx does not require a load capacitor, but is
stable with any capacitive load.
Unloaded, the REF30xx can be operated with supplies within
1mV of output voltage. All models are specified for the wide
temperature range, –40°C to +125°C.
APPLICATIONS
q
PORTABLE, BATTERY-POWERED EQUIPMENT
q
DATA ACQUISITION SYSTEMS
q
MEDICAL EQUIPMENT
q
HAND-HELD TEST EQUIPMENT
PRODUCT
REF3012
REF3020
REF3025
REF3030
REF3033
REF3040
VOLTAGE (V)
1.25
2.048
2.5
3.0
3.3
4.096
DROPOUT VOLTAGE vs LOAD CURRENT
350
IN
1
REF3012
REF3020
REF3025
REF3030
REF3033
REF3040
SOT23-3
300
Dropout Voltage (mV)
250
200
150
100
50
0
0
5
10
15
20
25
30
Load Current (mA)
3
GND
OUT
2
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright © 2002-2004, Texas Instruments Incorporated
www.ti.com