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BL-HG036D-TRB 参数 Datasheet PDF下载

BL-HG036D-TRB图片预览
型号: BL-HG036D-TRB
PDF下载: 下载PDF文件 查看货源
内容描述: 黄绿色适合所有SMT装配方法。 [Yellow Green Suitable for all SMT assembly methods.]
分类和应用: 光电
文件页数/大小: 7 页 / 216 K
品牌: BRIGHT [ BRIGHT LED ELECTRONICS CORP ]
 浏览型号BL-HG036D-TRB的Datasheet PDF文件第1页浏览型号BL-HG036D-TRB的Datasheet PDF文件第2页浏览型号BL-HG036D-TRB的Datasheet PDF文件第3页浏览型号BL-HG036D-TRB的Datasheet PDF文件第4页浏览型号BL-HG036D-TRB的Datasheet PDF文件第6页浏览型号BL-HG036D-TRB的Datasheet PDF文件第7页  
BRIGHT LED ELECTRONICS CORP.
SINCE 1981
BL-HG036D-TRB
Reliability Test
Classification
Test Item
Operation Life
Reference Standard
MIL-STD-750:1026
MIL-STD-883:1005
JIS-C-7021 :B-1
MIL-STD-202:103B
JIS-C-7021 :B-11
MIL-STD-883:1008
JIS-C-7021 :B-10
JIS-C-7021
:B-12
Test Conditions
Ta=Under RoomTemperature As Per Data
Sheet Maximum Rating
Test Time=1000HRS(-24HRS,+72HRS)@
20mA
Ta=+65℃±5℃
RH=90%-95%
Test time=240hrs±2HRS
High Ta=+105℃±5℃
Test time=1,000hrs(-24HRS,+72HRS)
Low Ta=-55℃±5℃
Test time=1,000hrs(-24HRS,+72HRS)
+105℃ ~ +25℃ ~ -55℃ ~ +25℃
30min
5min 30min 5min
Test Time=10cycle
IR-Reflow In-Board, 2
(10min)~-40±5℃(10min)
Test Time=10cycle
T.sol=260±5℃
Dwell Time=10±1secs
Times
85±5
0/20
Result
0/20
Endurance
Test
High
Temperature
High Humidity
Storage
High
Temperature
Storage
Low
Temperature
Storage
Temperature
Cycling
0/20
0/20
0/20
Thermal Shock
Solder
Resistance
Environmental IR-Reflow
Test
MIL-STD-202:107D
MIL-STD-750:1051
MIL-STD-883:1010
JIS-C-7021 :A-4
MIL-STD-202:107D
MIL-STD-750:1051
MIL-STD-883:1011
MIL-STD-202:201A
MIL-STD-750:2031
JIS-C-7021 :A-1
-
0/20
0/20
0/20
0/20
0/20
0/20
0/20
0/20
0/20
0/20
0/20
0/20
Solderability
-
Solderability
-
Ramp-up rate(183℃ to Peak)+3℃ 1sec
max
Temp maintain at125±25℃ 120sec max
Temp maintain above 183℃ 60�½�150sec
Peak temperature range 235℃�½�240℃
Time within5℃ of actual Pwck
Temperature10-30sec
Ramp-down rate+6℃ 1sec max
T.sol=235±5℃
Immesion time 2±0.5sec
Immesion rate 25±2.5mm/sec
Coverage≧95% of the dipped surface
Judgment criteria of failure for the reliability
Measuring items
Forward voltage
Reverse current
Luminous intensity
Symbol
V
F
( V)
I
R
(uA)
Iv ( mcd )
Measuring conditions
I
F
=20mA
V
R
=5V
I
F
=20mA
Judgement criteria for failure
Over Ux1.2
Over Ux2
Below SX0.5
Note:
1.U means the upper limit of specified characteristics.
S means initial value.
2.Measurment shall be taken between 2 hours and after the test pieces have been returned to
normal ambient conditions after completion of each test.
Ver.2.0 Page 5 of 7