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BS62LV256SCP70 参数 Datasheet PDF下载

BS62LV256SCP70图片预览
型号: BS62LV256SCP70
PDF下载: 下载PDF文件 查看货源
内容描述: 超低功耗CMOS SRAM 32K ×8位 [Very Low Power CMOS SRAM 32K X 8 bit]
分类和应用: 静态存储器
文件页数/大小: 10 页 / 242 K
品牌: BSI [ BRILLIANCE SEMICONDUCTOR ]
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BS62LV256
WRITE CYCLE 2
(1,6)
t
WC
ADDRESS
t
CW
(11)
CE
(5)
t
AW
WE
t
AS
t
WHZ
D
OUT
(4,10)
t
WP
(2)
t
OW
t
DW
t
DH
(8,9)
(7)
(8)
D
IN
NOTES:
1. WE must be high during address transitions.
2. The internal write time of the memory is defined by the overlap of CE and WE low. All signals
must be active to initiate a write and any one signal can terminate a write by going inactive. The
data input setup and hold timing should be referenced to the second transition edge of the
signal that terminates the write.
3. t
WR
is measured from the earlier of CE or WE going high at the end of write cycle.
4. During this period, DQ pins are in the output state so that the input signals of opposite phase to
the outputs must not be applied.
5. If the CE low transition occurs simultaneously with the WE low transitions or after the WE
transition, output remain in a high impedance state.
6. OE is continuously low (OE = V
IL
).
7. D
OUT
is the same phase of write data of this write cycle.
8. D
OUT
is the read data of next address.
9. If CE is low during this period, DQ pins are in the output state. Then the data input signals of
opposite phase to the outputs must not be applied to them.
10. Transition is measured
±
500mV from steady state with C
L
= 5pF.
The parameter is guaranteed but not 100% tested.
11. t
CW
is measured from the later of CE going low to the end of write.
R0201-BS62LV256
7
Revision 2.6
Sep.
2006