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BS62LV8001FCP70 参数 Datasheet PDF下载

BS62LV8001FCP70图片预览
型号: BS62LV8001FCP70
PDF下载: 下载PDF文件 查看货源
内容描述: 超低功耗CMOS SRAM 1M ×8位 [Very Low Power CMOS SRAM 1M X 8 bit]
分类和应用: 静态存储器
文件页数/大小: 10 页 / 204 K
品牌: BSI [ BRILLIANCE SEMICONDUCTOR ]
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BS62LV8001
n
DC ELECTRICAL CHARACTERISTICS (T
A
=-40
O
C to +85
O
C)
PARAMETER
NAME
V
CC
V
IL
V
IH
I
IL
I
LO
V
OL
V
OH
I
CC
(5)
I
CC1
I
CCSB
I
CCSB1
(6)
PARAMETER
Power Supply
Input Low Voltage
Input High Voltage
Input Leakage Current
Output Leakage Current
Output Low Voltage
Output High Voltage
Operating Power Supply
Current
Operating Power Supply
Current
Standby Current
TTL
Standby Current
CMOS
O
TEST CONDITIONS
MIN.
2.4
-0.5
(2)
TYP.
(1)
--
--
--
--
--
--
--
--
--
--
0.8
3.5
MAX.
5.5
0.8
V
CC
+0.3
1
1
0.4
--
31
76
2
10
1.0
2.0
8.0
50
(3)
UNITS
V
V
V
uA
uA
V
V
mA
mA
mA
uA
2.2
V
IN
= 0V to V
CC
V
I/O
= 0V to V
CC
,
CE1= V
IH
or CE2= V
IL
, or OE = V
IH
V
CC
= Max, I
OL
= 2.0mA
V
CC
= Min, I
OH
= -1.0mA
CE1 = V
IL
and CE2 = V
IH
,
I
DQ
= 0mA, f =
(4)
F
MAX
--
--
--
2.4
V
CC
=3.0V
V
CC
=5.0V
V
CC
=3.0V
V
CC
=5.0V
V
CC
=3.0V
V
CC
=5.0V
V
CC
=3.0V
V
CC
=5.0V
--
--
--
--
CE1 = V
IL
and CE2 = V
IH
,
I
DQ
= 0mA, f = 1MHz
CE1 = V
IH
, or CE2 = V
IL
,
I
DQ
= 0mA
CE1≧V
CC
-0.2V or CE2≦0.2V,
V
IN
≧V
CC
-0.2V or V
IN
≦0.2V
1. Typical characteristics are at T
A
=25 C and not 100% tested.
2. Undershoot: -1.0V in case of pulse width less than 20 ns.
3. Overshoot: V
CC
+1.0V in case of pulse width less than 20 ns.
4. F
MAX
=1/t
RC.
O
5. I
CC (MAX.)
is 30mA/75mA at V
CC
=3.0V/5.0V and T
A
=70 C.
O
6. I
CCSB1(MAX.)
is 4.0uA/25uA at V
CC
=3.0V/5.0V and T
A
=70 C.
n
DATA RETENTION CHARACTERISTICS (T
A
= -40
O
C to +85
O
C)
SYMBOL
V
DR
I
CCDR
(3)
t
CDR
t
R
PARAMETER
V
CC
for Data Retention
Data Retention Current
Chip Deselect to Data
Retention Time
Operation Recovery Time
O
TEST CONDITIONS
CE1≧V
CC
-0.2V or CE2≦0.2V,
V
IN
≧V
CC
-0.2V or V
IN
≦0.2V
CE1≧V
CC
-0.2V or CE2≦0.2V,
V
IN
≧V
CC
-0.2V or V
IN
≦0.2V
MIN.
1.5
--
0
TYP.
(1)
--
0.4
--
MAX.
--
4.0
--
--
UNITS
V
uA
ns
ns
See Retention Waveform
t
RC
(2)
--
1. V
CC
=1.5V, T
A
=25 C and not 100% tested.
2. t
RC
= Read Cycle Time.
O
3. I
CCRD(Max.)
is 2.0uA at T
A
=70 C.
n
LOW V
CC
DATA RETENTION WAVEFORM (1) (CE1 Controlled)
Data Retention Mode
V
CC
V
IH
V
CC
V
DR
≧1.5V
V
CC
t
CDR
CE1≧V
CC
- 0.2V
t
R
V
IH
CE1
R0201-BS62LV8001
3
Revision
2.3
May.
2006