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BS62LV2006STCG55 参数 Datasheet PDF下载

BS62LV2006STCG55图片预览
型号: BS62LV2006STCG55
PDF下载: 下载PDF文件 查看货源
内容描述: 超低功耗CMOS SRAM 256K ×8位 [Very Low Power CMOS SRAM 256K X 8 bit]
分类和应用: 静态存储器
文件页数/大小: 10 页 / 328 K
品牌: BSI [ BRILLIANCE SEMICONDUCTOR ]
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BS62LV2006
DC ELECTRICAL CHARACTERISTICS (T
A
= -40
O
C to +85
O
C)
PARAMETER
NAME
V
CC
V
IL
V
IH
I
IL
I
LO
V
OL
V
OH
I
CC
(5)
I
CC1
I
CCSB
I
CCSB1
(6)
PARAMETER
Power Supply
Input Low Voltage
Input High Voltage
Input Leakage Current
Output Leakage Current
Output Low Voltage
Output High Voltage
Operating Power Supply
Current
Operating Power Supply
Current
Standby Current – TTL
Standby Current – CMOS
O
TEST CONDITIONS
MIN.
2.4
-0.5
(2)
TYP.
(1)
--
--
--
--
--
--
--
--
--
--
--
--
--
0.1
0.6
MAX.
5.5
0.8
V
CC
+0.3
1
1
0.4
--
23
55
2
10
0.5
1.0
2.0
20
(3)
UNITS
V
V
V
UA
UA
V
V
mA
mA
mA
uA
2.2
V
CC
= Max, V
IN
= 0V to V
CC
V
CC
= Max, CE1= V
IH
, CE2= V
IL
, or
OE = V
IH
, V
I/O
= 0V to V
CC
V
CC
= Max, I
OL
= 2.0mA
V
CC
= Min, I
OH
= -1.0mA
CE1 = V
IL
, CE2 = V
IH
,
(4)
I
DQ
= 0mA, f = F
MAX
CE1 = V
IL
, CE2 = V
IH
,
I
DQ
= 0mA, f = 1MHz
CE1 = V
IH
, or CE2 = V
IL
,
I
DQ
= 0mA
CE1≧V
CC
-0.2V or CE2≦0.2V,
V
IN
≧V
CC
-0.2V or V
IN
≦0.2V
V
CC
=3.0V
V
CC
=5.0V
V
CC
=3.0V
V
CC
=5.0V
V
CC
=3.0V
V
CC
=5.0V
V
CC
=3.0V
V
CC
=5.0V
--
--
--
2.4
--
--
--
--
--
--
--
--
1. Typical characteristics are at T
A
=25 C and not 100% tested.
2. Undershoot: -1.0V in case of pulse width less than 20 ns.
3. Overshoot: V
CC
+1.0V in case of pulse width less than 20 ns.
4. F
MAX
=1/t
RC.
O
5. I
CC (MAX.)
is 22mA/53mA at V
CC
=3.0V/5.0V and T
A
=70 C.
O
6. I
CCSB1(MAX.)
is 0.7uA/6.0uA at V
CC
=3.0V/5.0V and T
A
=70 C.
DATA RETENTION CHARACTERISTICS (T
A
= -40
O
C to +85
O
C)
SYMBOL
V
DR
I
CCDR
(3)
t
CDR
t
R
PARAMETER
V
CC
for Data Retention
Data Retention Current
Chip Deselect to Data
Retention Time
Operation Recovery Time
O
TEST CONDITIONS
CE1≧V
CC
-0.2V or CE2≦0.2V,
V
IN
≧V
CC
-0.2V or V
IN
≦0.2V
CE1≧V
CC
-0.2V or CE2≦0.2V,
V
IN
≧V
CC
-0.2V or V
IN
≦0.2V
MIN.
1.5
--
0
TYP.
(1)
--
0.05
--
MAX.
--
1.0
--
--
UNITS
V
uA
ns
ns
See Retention Waveform
t
RC
(2)
--
1. V
CC
=1.5V, T
A
=25 C and not 100% tested.
2. t
RC
= Read Cycle Time.
O
3. I
CCRD(Max.)
is 0.5uA at T
A
=70 C.
LOW V
CC
DATA RETENTION WAVEFORM (1) (CE1 Controlled)
Data Retention Mode
V
CC
V
CC
V
DR
≧1.5V
V
CC
t
CDR
V
IH
CE1≧V
CC
- 0.2V
t
R
V
IH
CE1
R0201-BS62LV2006
3
Revision
1.4
Oct.
2008