Advanced Information
CAT25C01/02/04/08/16
Figure 1. Sychronous Data Timing
V
IH
t
CS
CS
V
IL
t
CSS
V
IH
t
CSH
SCK
V
IL
t
SU
V
IH
t
WH
t
H
t
WL
SI
VIL
VALID IN
t
RI
tFI
t
V
t
HO
t
DIS
HI-Z
V
OH
SO
V
OL
HI-Z
Note: Dashed Line= mode (1, 1) – – – – –
A.C. CHARACTERISTICS
Limits
1.8V-6.0V
SYMBOL PARAMETER
t
SU
t
H
t
WH
t
WL
f
SCK
t
LZ
t
RI(1)
t
FI(1)
t
HD
t
CD
t
WC
t
V
t
HO
t
DIS
t
HZ
t
CS
t
CSS
t
CSH
t
WPS
t
WPH
Data Setup Time
Data Hold Time
SCK High Time
SCK Low Time
Clock Frequency
HOLD
to Output Low Z
Input Rise Time
Input Fall Time
HOLD
Setup Time
HOLD
Hold Time
Write Cycle Time
Output Valid from Clock Low
Output Hold Time
Output Disable Time
HOLD
to Output High Z
CS
High Time
CS
Setup Time
CS
Hold Time
WP
Setup Time
WP
Hold Time
500
500
500
150
150
0
250
150
100
100
100
50
50
100
100
10
250
0
75
50
100
100
100
50
50
Min.
50
50
250
250
DC
1
50
2
2
40
40
5
80
0
75
50
2.5V-6.0V
Max.
20
20
75
75
DC
5
50
2
2
40
40
5
80
4.5V-5.5V
Min.
20
20
40
40
DC
10
50
2
2
Max.
ns
ns
ns
ns
MHz
ns
µs
µs
ns
ns
ms
ns
ns
ns
ns
ns
ns
ns
ns
ns
C
L
= 100pF
C
L
= 50pF
Test
UNITS Conditions
V
IH
= 2.4V
C
L
= 100pF
V
OL
= 0.8V
V
OH
= 2.0v
Max. Min.
NOTE:
(1) This parameter is tested initially and after a design or process change that affects the parameter.
3
Doc. No. 25067-00 5/00
CATALYST [ CATALYST SEMICONDUCTOR ]
