CAT24C01/02/04/08/16
A.C. CHARACTERISTICS
(1)
V
CC
= 1.8 V to 5.5 V, T
A
= -40°C to 85°C.
Standard
Symbol
F
SCL
t
HD:STA
t
LOW
t
HIGH
t
SU:STA
t
HD:DAT
t
SU:DAT
t
R
t
F(2)
t
SU:STO
t
BUF
t
AA
t
DH
T
i(2)
t
SU:WP
t
HD:WP
t
WR
t
PU(2, 3)
Note:
(1) Test conditions according to “A.C. Test Conditions” table.
(2) Tested initially and after a design or process change that affects this parameter.
(3) t
PU
is the delay between the time V
CC
is stable and the device is ready to accept commands.
Fast
Min
0.6
1.3
0.6
0.6
0
100
Max
400
Units
kHz
μs
μs
μs
μs
μs
ns
300
300
0.6
1.3
ns
ns
μs
μs
0.9
100
100
0
2.5
μs
ns
ns
μs
μs
5
1
ms
ms
Parameter
Clock Frequency
START Condition Hold Time
Low Period of SCL Clock
High Period of SCL Clock
START Condition Setup Time
Data In Hold Time
Data In Setup Time
SDA and SCL Rise Time
SDA and SCL Fall Time
STOP Condition Setup Time
Bus Free Time Between STOP and START
SCL Low to Data Out Valid
Data Out Hold Time
Noise Pulse Filtered at SCL and SDA Inputs
WP Setup Time
WP Hold Time
Write Cycle Time
Power-up to Ready Mode
Min
4
4.7
4
4.7
0
250
Max
100
1000
300
4
4.7
3.5
100
100
0
2.5
5
1
A.C. TEST CONDITIONS
Input Levels
Input Rise and Fall Times
Input Reference Levels
Output Reference Levels
Output Load
0.2 x V
CC
to 0.8 x V
CC
≤
50 ns
0.3 x V
CC
, 0.7 x V
CC
0.5 x V
CC
Current Source: I
OL
= 3 mA (V
CC
≥
2.5 V); I
OL
= 1 mA (V
CC
< 2.5 V); C
L
= 100 pF
© 2006 by Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
3
Doc No. 1115, Rev. C
CATALYST [ CATALYST SEMICONDUCTOR ]
