DATA SHEET
6/10
6. Reliability
(1) Details of the tests
Test Item
Continuous Operation Test
Test Condition
Ta=-30 C, I
F
=350 mA× 1000 hours(with Al-fin)
Ta=60 C, I
F
=350 mA× 1000 hours(with Al-fin)
Ta=85 C, I
F
=350 mA× 1000 hours(with Al-fin)
High Temperature Storage Test
100 C × 1000 hours
Low Temperature Storage Test
-40 C × 1000 hours
Moisture-proof Test
Thermal Shock Test
60 C, 90 %RH for 1000 hours
-40 C × 30 minutes – 100 C × 30 minutes, 100 cycle
(Ta=25 C)
(2) Judgment Criteria of Failure for Reliability Test
Total Luminous Flux
Forward Voltage
Measuring Item
Symbol
Φv
V
F
Measuring Condition
I
F
=350mA
I
F
=350mA
Judgment Criteria for Failure
> U × 1.1
< S × 0.85
U defines the upper limit of the specified characteristics. S defines the initial value.
Note: Measurement shall be taken between 2 hours and 24 hours, and the test pieces should be
returned to the normal ambient conditions after the completion of each test.
Symbol
Name
CITIZEN ELECTRONICS CO.,LTD. JAPAN
CL-L103-MC3WW1-C
CITILED
Ref.CE-P1050 04/11
CITIZEN [ CITIZEN ELECTRONICS CO., LTD. ]
