DATA SHEET
6/11
6. Reliability
(1) Details of the tests
Test Item
Test Condition
Ta=25 C,I
F
=480 mA× 1000 hours(with Al-fin)
Continuous Operation Test
Ta=50 C,I
F
=480 mA× 1000 hours(with Al-fin)
Moisture-proof Test
Thermal Shock Test
60 C, 90 %RH for 1000 hours
-40 C × 30 minutes – 100 C × 30 minutes, 100 cycle
High Temperature Storage Test
100 C × 1000 hours
Low Temperature Storage Test
-40 C × 1000 hours
(2) Judgment Criteria of Failure for Reliability Test
Total Luminous Flux
Forward Voltage
Measuring Item
Symbol
Φv
V
F
Measuring Condition
I
F
=480mA
I
F
=480mA
Judgment Criteria for Failure
(Ta=25 C)
> U × 1.1
< S × 0.85
U defines the upper limit of the specified characteristics. S defines the initial value.
Note: Measurement shall be taken between 2 hours and 24 hours, and the test pieces should be
returned to the normal ambient conditions after the completion of each test.
CL-L251-MC4L reliability test results will be used for CL-L251-MC4W1-C.
Symbol
Name
CITIZEN ELECTRONICS CO.,LTD. JAPAN
CL-L251-MC4W1-C
CITILED
Ref.CE-P1162 05/11 R1(0711)
CITIZEN [ CITIZEN ELECTRONICS CO., LTD. ]
