CY62137V MoBL
Switching Characteristics
Over the Operating Range
Parameter
Read Cycle
t
RC
t
AA
t
OHA
t
ACE
t
DOE
t
LZOE
t
HZOE
t
LZCE
t
HZCE
t
PU
t
PD
t
DBE
t
LZBE (9)
t
HZBE
Write Cycle
[10, 11]
t
WC
t
SCE
t
AW
t
HA
t
SA
t
PWE
t
SD
t
HD
t
HZWE
t
LZWE
t
BW
Write Cycle Time
CE LOW to Write End
Address Set-up to Write End
Address Hold from Write End
Address Set-up to Write Start
WE Pulse Width
Data Set-up to Write End
Data Hold from Write End
WE LOW to High-Z
[7, 8]
WE HIGH to Low-Z
[7]
BHE / BLE LOW to End of Write
5
50
55
45
45
0
0
40
25
0
20
10
60
70
60
60
0
0
50
30
0
25
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Read Cycle Time
Address to Data Valid
Data Hold from Address Change
CE LOW to Data Valid
OE LOW to Data Valid
OE LOW to Low-Z
[7]
OE HIGH to High-Z
[7, 8]
CE LOW to Low-Z
[7]
CE HIGH to High-Z
[7, 8]
CE LOW to Power-up
CE HIGH to Power-down
BHE / BLE LOW to Data Valid
BHE / BLE LOW to Low-Z
BHE / BLE HIGH to High-Z
5
25
0
55
55
5
25
10
25
0
70
70
5
25
10
25
10
55
25
5
25
55
55
10
70
35
70
70
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Description
[6]
55 ns
Min.
Max.
Min.
70 ns
Max.
Unit
Notes:
6. Test conditions assume signal transition time of 5 ns or less, timing reference levels of 1.5V, input levels of 0 to V
CC
typ., and output loading of the specified
I
OL
/I
OH
and 30 pF load capacitance.
7. At any given temperature and voltage condition, t
HZCE
is less than t
LZCE
, t
HZOE
is less than t
LZOE
, and t
HZWE
is less than t
LZWE
for any given device.
8. t
HZOE
, t
HZCE
, and t
HZWE
are specified with C
L
= 5 pF as in (b) of AC Test Loads. Transition is measured ±500 mV from steady-state voltage.
9. If both byte enables are toggled together this value is 10 ns.
10. The internal write time of the memory is defined by the overlap of CE LOW and WE LOW. Both signals must be LOW to initiate a write and either signal can terminate
a write by going HIGH. The data input set-up and hold timing should be referenced to the rising edge of the signal that terminates the write.
11. The minimum write cycle time for write cycle #3 (WE controlled, OE LOW) is the sum of t
HZWE
and t
SD
.
Document #: 38-05051 Rev. *B
Page 5 of 11
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