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CY7C1021-12VC 参数 Datasheet PDF下载

CY7C1021-12VC图片预览
型号: CY7C1021-12VC
PDF下载: 下载PDF文件 查看货源
内容描述: 64K ×16静态RAM [64K x 16 Static RAM]
分类和应用: 存储内存集成电路静态存储器光电二极管
文件页数/大小: 9 页 / 184 K
品牌: CYPRESS [ CYPRESS ]
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CY7C1021  
AC Test Loads and Waveforms  
R 481  
R 481Ω  
ALL INPUT PULSES  
90%  
10%  
5V  
5V  
OUTPUT  
3.0V  
GND  
90%  
10%  
OUTPUT  
R2  
255Ω  
R2  
255Ω  
30 pF  
5 pF  
INCLUDING  
JIG AND  
SCOPE  
INCLUDING  
JIG AND  
SCOPE  
< 3 ns  
< 3 ns  
(b)  
1021-3  
(a)  
167  
30 pF  
1021-4  
1.73V  
OUTPUT  
Equivalent to:  
THÉVENIN  
EQUIVALENT  
Switching Characteristics[5] Over the Operating Range  
7C1021-10  
7C1021-12  
7C1021-15  
7C1021-20  
Parameter  
Description  
Min.  
Max. Min. Max. Min. Max. Min. Max. Unit  
READ CYCLE  
tRC  
Read Cycle Time  
Address to Data Valid  
10  
12  
3
15  
3
20  
3
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tAA  
10  
12  
15  
20  
tOHA  
tACE  
tDOE  
tLZOE  
tHZOE  
tLZCE  
tHZCE  
tPU  
Data Hold from Address Change  
CE LOW to Data Valid  
OE LOW to Data Valid  
OE LOW to Low Z[6]  
OE HIGH to High Z[6, 7]  
CE LOW to Low Z[6]  
CE HIGH to High Z[6, 7]  
CE LOW to Power-Up  
CE HIGH to Power-Down  
Byte Enable to Data Valid  
Byte Enable to Low Z  
Byte Disable to High Z  
3
10  
5
12  
6
15  
7
20  
9
0
3
0
0
3
0
0
3
0
0
3
0
5
5
6
6
7
7
9
9
tPD  
10  
5
12  
6
15  
7
20  
9
tDBE  
tLZBE  
tHZBE  
0
0
0
0
5
6
7
9
WRITE CYCLE[8]  
tWC  
tSCE  
tAW  
Write Cycle Time  
10  
8
12  
9
15  
10  
10  
0
20  
12  
12  
0
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
CE LOW to Write End  
Address Set-Up to Write End  
Address Hold from Write End  
Address Set-Up to Write Start  
WE Pulse Width  
7
8
tHA  
0
0
tSA  
0
0
0
0
tPWE  
tSD  
7
8
10  
8
12  
10  
0
Data Set-Up to Write End  
Data Hold from Write End  
WE HIGH to Low Z[6]  
5
6
tHD  
0
0
0
tLZWE  
tHZWE  
tBW  
3
3
3
3
WE LOW to High Z[6, 7]  
5
6
7
9
Byte Enable to End of Write  
7
8
9
12  
Shaded areas contain preliminary information.  
Notes:  
5. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading of the specified  
IOL/IOH and 30-pF load capacitance.  
6. At any given temperature and voltage condition, tHZCE is less than tLZCE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any given device.  
7.  
tHZOE, tHZBE, tHZCE, and tHZWE are specified with a load capacitance of 5 pF as in part (b) of AC Test Loads. Transition is measured ±500 mV from steady-state voltage.  
8. The internal write time of the memory is defined by the overlap of CE LOW, WE LOW and BHE / BLE LOW. CE, WE and BHE / BLE must be LOW to initiate a write,  
and the transition of these signals can terminate the write. The input data set-up and hold timing should be referenced to the leading edge of the signal that terminates the write.  
Document #: 38-05054 Rev. **  
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