DS1005
TEST SETUP DESCRIPTION
Figure 3 illustrates the hardware configuration used for measuring the timing parameters on the DS1005.
The input waveform is produced by a precision pulse generator under software control. Time delays are
measured by a time interval counter (20 ps resolution) connected between the input and each tap. Each
tap is selected and connected to the counter by a VHF switch control unit. All measurements are fully
automated, with each instrument controlled by a central computer over an IEEE 488 bus.
TEST CONDITIONS
INPUT:
Ambient Temperature
Supply Voltage (V
CC
)
Input Pulse
25°C
±=3°C
5.0V
±=0.1V
High = 3.0V
±=0.1V
Low = 0.0V
±=0.1V
50 ohm maximum
3.0 ns maximum
500 ns
1
µs
Source Impedance
Rise and Fall Time
Pulse Width
Period
OUTPUT:
Each output is loaded with the equivalent of a 74F04 input gate. Delay is measured at the 1.5V level on
the rising and falling edge.
NOTE:
Above conditions are for test only and do not restrict the operation of the device under other data sheet
conditions.
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DALLAS [ DALLAS SEMICONDUCTOR ]
