EL2257C/EL2357C
EL2257C/EL2357C
125 MHz Single Supply, Clamping Op Amps
Closed Loop AC Electrical Characteristics
V
S
=+5V, GND=0V, T
A
=25°C, V
CM
=+1.5V, V
OUT
=+1.5V, V
CLAMP
=+5V, V
ENABLE
=+5V, A
V
=+1, RF=0Ω, RL=150Ω to GND pin,
unless otherwise specified
[1]
Test
Level
V
V
V
V
V
V
V
V
V
V
V
I
V
V
V
V
V
V
V
V
V
V
V
V
V
Parameter
BW
Description
-3 dB Bandwidth (Vout=400 mVp-p)
Test Conditions
V
S
=+5V, A
V
=+1, R
F
=0Ω
V
S
=+5V, A
V
=-1, R
F
=500Ω
V
S
=+5V, A
V
=+2, R
F
=500Ω
V
S
=+5V, A
V
=+10, R
F
=500Ω
V
S
=+12V, A
V
=+1, R
F
=0Ω
V
S
=+3V, A
V
=+1, R
F
=0Ω
Min
Typ
125
60
60
6
150
100
25
30
20
60
55
Max
Units
MHz
MHz
MHz
MHz
MHz
MHz
MHz
MHz
MHz
MHz
°
V/µs
V/µs
ns
%
ns
ns
ns
%
°
nV/ÐH
z
pA/ÐH
z
ns
ns
ns
BW
±0.1 dB Bandwidth (Vout=400 mVp-p)
V
S
=+12V, A
V
=+1, R
F
=0Ω
V
S
=+5V, A
V
=+1, R
F
=0Ω
V
S
=+3V, A
V
=+1, R
F
=0Ω
GBWP
PM
SR
t
R
,t
F
OS
t
PD
t
S
dG
dP
e
N
i
N
t
DIS
t
EN
t
CL
Gain Bandwidth Product
Phase Margin
Slew Rate
Rise Time, Fall Time
Overshoot
Propagation Delay
0.1% Settling Time
0.01% Settling Time
Differential
Gain
[2]
[2]
V
S
=+12V, @ A
V
=+10
R
L
=1 kΩ, CL=6 pF
V
S
=+10V, R
L
=150Ω, Vout=0V to +6V
V
S
=+5V, R
L
=150Ω, Vout=0V to +3V
±0.1V Step
±0.1V Step
±0.1V step
V
S
=±5V, R
L
=500Ω, A
V
=+1, V
OUT
=±3V
V
S
=±5V, R
L
=500Ω, A
V
=+1, V
OUT
=±3V
A
V
=+2, R
F
=1 kΩ
A
V
=+2, R
F
=1 kΩ
f=10 kHz
f=10 kHz
200
275
300
2.8
10
3.2
40
75
0.05
0.05
48
1.25
50
25
7
Differential Phase
Input Noise Voltage
Input Noise Current
Disable Time
[3]
Enable Time
[3]
Clamp Overload Recovery
1. All AC tests are performed on a “warmed up” part, except slew rate, which is pulse tested.
2. Standard NTSC signal = 286 mVp-p, f=3.58 MHz, as V
IN
is swept from 0.6V to 1.314V. R
L
is DC coupled.
3. Disable/Enable time is defined as the time from when the logic signal is applied to the ENABLE pin to when the supply current has reached half its
final value.
4
ELANTEC [ ELANTEC SEMICONDUCTOR ]
