EL7242C EL7252C
Dual Input High Speed Dual Channel Power MOSFET Driver
Absolute Maximum Ratings
Supply (V
a
to Gnd)
Input Pins
Combined Peak Output Current
Storage Temperature Range
Ambient Operating Temperature
16 5V
b
0 3V to
a
0 3V above V
a
4A
b
65 C to
a
150 C
b
40 C to
a
85 C
Operating Junction Temperature
Power Dissipation
SOIC
PDIP
125 C
570 mW
1050 mW
Important Note
All parameters having Min Max specifications are guaranteed The Test Level column indicates the specific device testing actually
performed during production and Quality inspection Elantec performs most electrical tests using modern high-speed automatic test
equipment specifically the LTX77 Series system Unless otherwise noted all tests are pulsed tests therefore T
J
e
T
C
e
T
A
Test Level
I
II
III
IV
V
Test Procedure
100% production tested and QA sample tested per QA test plan QCX0002
100% production tested at T
A
e
25 C and QA sample tested at T
A
e
25 C
T
MAX
and T
MIN
per QA test plan QCX0002
QA sample tested per QA test plan QCX0002
Parameter is guaranteed (but not tested) by Design and Characterization Data
Parameter is typical value at T
A
e
25 C for information purposes only
DC Electrical Characteristics
T
A
e
25 C
Parameter
Input
V
IH
I
IH
V
IL
I
IL
V
HVS
Output
R
OH
R
OL
I
PK
I
DC
Power Supply
I
S
V
S
Power Supply Current
Operating Voltage
Pull-Up Resistance
Pull-Down Resistance
Peak Output Current
Continuous Output Current
Logic ‘‘1’’ Input Voltage
Logic ‘‘1’’ Input Current
Logic ‘‘0’’ Input Voltage
Logic ‘‘0’’ Input Current
Input Hysteresis
0V
V
a
Description
V
e
15V unless otherwise specified
Min
Typ
Max
Test
Level
Units
Test
Conditions
24
01
10
08
01
03
10
I
I
I
I
V
V
mA
V
mA
V
I
OUT
e b
100 mA
I
OUT
e a
100 mA
Source
Sink
Source Sink
100
3
4
2
2
6
6
I
I
IV
I
X
X
A
mA
TD is 3 1in
Inputs High
45
1
25
16
I
I
mA
V
2
ELANTEC [ ELANTEC SEMICONDUCTOR ]
