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EN25F05-75VIP 参数 Datasheet PDF下载

EN25F05-75VIP图片预览
型号: EN25F05-75VIP
PDF下载: 下载PDF文件 查看货源
内容描述: 512 Kbit的串行闪存与4KB的部门统一 [512 Kbit Serial Flash Memory with 4Kbytes Uniform Sector]
分类和应用: 闪存
文件页数/大小: 31 页 / 422 K
品牌: EON [ EON SILICON SOLUTION INC. ]
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EN25F05
Read Data Bytes at Higher Speed (FAST_READ) (0Bh)
The device is first selected by driving Chip Select (CS#) Low. The instruction code for the Read Data
Bytes at Higher Speed (FAST_READ) instruction is followed by a 3-byte address (A23-A0) and a
dummy byte, each bit being latched-in during the rising edge of Serial Clock (CLK). Then the
memory contents, at that address, is shifted out on Serial Data Output (DO), each bit being shifted
out, at a maximum frequency FR, during the falling edge of Serial Clock (CLK).
The instruction sequence is shown in Figure 10.. The first byte addressed can be at any location.
The address is automatically incremented to the next higher address after each byte of data is shift-
ed out. The whole memory can, therefore, be read with a single Read Data Bytes at Higher Speed
(FAST_READ) instruction. When the highest address is reached, the address counter rolls over to
000000h, allowing the read sequence to be continued indefinitely.
The Read Data Bytes at Higher Speed (FAST_READ) instruction is terminated by driving Chip
Select (CS#) High. Chip Select (CS#) can be driven High at any time during data output. Any Read
Data Bytes at Higher Speed (FAST_READ) instruction, while an Erase, Program or Write cycle is in
progress, is rejected without having any effects on the cycle that is in progress.
Figure 10. Fast Read Instruction Sequence Diagram
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
13
©2004 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. B, Issue Date: 2008/06/23