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EN25Q16A 参数 Datasheet PDF下载

EN25Q16A图片预览
型号: EN25Q16A
PDF下载: 下载PDF文件 查看货源
内容描述: 16兆位串行闪存与4K字节扇区制服 [16 Megabit Serial Flash Memory with 4Kbyte Uniform Sector]
分类和应用: 闪存
文件页数/大小: 53 页 / 1059 K
品牌: EON [ EON SILICON SOLUTION INC. ]
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EN25Q16A
Table 4A. Instruction Set
Instruction Name
EQPI
RSTQIO
(1) /
Release Quad I/O or
Fast Read Enhanced
Mode
Byte 1
Code
38h
FFh
66h
99h
06h
04h
05h
01h
02h
20h
D8h
C7h/ 60h
B9h
Byte 2
Byte 3
Byte 4
Byte 5
Byte 6
n-Bytes
RSTEN
RST
(2)
Write Enable
Write Disable / Exit
OTP mode
Read Status
Register
Write Status
Register
Page Program
Sector Erase / OTP
erase
Block Erase
Chip Erase
Deep Power-down
Release from Deep
Power-down, and
read Device ID
Release from Deep
Power-down
Manufacturer/
Device ID
Read Identification
Enter OTP mode
(S7-S0)(3)
S7-S0
A23-A16
A23-A16
A23-A16
A15-A8
A15-A8
A15-A8
A7-A0
A7-A0
A7-A0
D7-D0
Next byte
continuous(4)
continuous
(5)
dummy
dummy
dummy
(ID7-ID0)
ABh
(6)
90h
9Fh
3Ah
dummy
(M7-M0)
dummy
(ID15-ID8)
00h
01h
(ID7-ID0)
(M7-M0)
(ID7-ID0)
(7)
(ID7-ID0)
(M7-M0)
Notes:
1. Device accepts eight-clocks command in Standard SPI mode, or two-clocks command in Quad SPI mode
2. RST command only executed if RSTEN command is executed first. Any intervening command will disable Reset.
3. Data bytes are shifted with Most Significant Bit first. Byte fields with data in parenthesis “( )” indicate data being read from the
device on the DO pin.
4. The Status Register contents will repeat continuously until CS# terminate the instruction.
5. The Device ID will repeat continuously until CS# terminate the instruction
6. The Manufacturer ID and Device ID bytes will repeat continuously until CS# terminate the instruction.
00h on Byte 4 starts with MID and alternate with DID, 01h on Byte 4 starts with DID and alternate with MID.
7. (M7-M0) : Manufacturer, (ID15-ID8) : Memory Type, (ID7-ID0) : Memory Capacity
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
11
©2004 Eon Silicon Solution, Inc.,
www.eonssi.com
Rev. E, Issue Date: 2011/07/14