EVERLIGHT ELECTRONICS CO.,LTD.
IRM-26xxT SERIES
Typical Electro-Optical Characteristics Curves
Fig.-9 Arrival Distance vs. Ambient Temperature
5.71
Transmission Distance Lc (m)
Reliability Test Item And Condition
The reliability of products shall be satisfied with items listed below.
Confidence level:90%
LTPD:10%
Test Items
Test Conditions
1 cycle -40℃
Temperature cycle
+100℃
n=22,c=0
Failure Judgement
Criteria
Samples(n)
Defective(c)
High temperature test Vcc:6V
1000hrs
Low temperature
storage
High temperature
High humidity
Temp: -40℃
1000hrs
Ta: 85℃,RH:85%
1000hrs
Temp: 260±5℃ 10sec
4mm From the bottom of the package.
Solder heat
Everlight Electronics Co., Ltd.
:
:
:
Device No
0.4 1
5.3
5.0 1
0.7
Ambient Temperature Ta (°C)
(15min)(5min)(15min)
300 cycle test
Temp: +100℃
L
0
≦
L×0.8
L
45
≦
L×0.8
n=22,c=0
n=22,c=0
L: Lower
specification limit
n=22,c=0
n=22,c=0
http:\\www.everlight.com
Prepared date
2-Mar-2007
Rev 1
Page: 9 of 10
SZDMO-026-070
Prepared by Zhang Meijuan