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100331 参数 Datasheet PDF下载

100331图片预览
型号: 100331
PDF下载: 下载PDF文件 查看货源
内容描述: 低功耗三D型触发器 [Low Power Triple D-Type Flip-Flop]
分类和应用: 触发器
文件页数/大小: 10 页 / 103 K
品牌: FAIRCHILD [ FAIRCHILD SEMICONDUCTOR ]
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100331
Absolute Maximum Ratings
(Note 1)
Storage Temperature (T
STG
)
Maximum Junction Temperature (T
J
)
Pin Potential to Ground Pin (V
EE
)
Input Voltage (DC)
Output Current
(DC Output HIGH)
ESD (Note 2)
65
°
C to
+
150
°
C
+
150
°
C
7.0V to
+
0.5V
V
EE
to
+
0.5V
Recommended Operating
Conditions
Case Temperature (T
C
)
Commercial
Industrial
Supply Voltage (V
EE
)
0
°
C to
+
85
°
C
40
°
C to
+
85
°
C
5.7V to
4.2V
50 mA
2000V
Note 1:
The “Absolute Maximum Ratings” are those values beyond which
the safety of the device cannot be guaranteed. The device should not be
operated at these limits. The parametric values defined in the Electrical
Characteristics tables are not guaranteed at the absolute maximum rating.
The “Recommended Operating Conditions” table will define the conditions
for actual device operation.
Note 2:
ESD testing conforms to MIL-STD-883, Method 3015.
Commercial Version
DC Electrical Characteristics
(Note 3)
V
EE
= −
4.2V to
5.7V, V
CC
=
V
CCA
=
GND, T
C
=
0°C to
+85°C
Symbol
Parameter
Min
Typ
V
OH
V
OL
V
OHC
V
OLC
V
IH
V
IL
I
IL
I
IH
I
EE
Output HIGH Voltage
Output LOW Voltage
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
Input LOW Current
Input HIGH Current
Power Supply Current
−122
−1165
−1830
0.5
240
−65
−1025
−1830
−1035
−1610
−870
−1475
−955
−1705
Max
−870
−1620
Units
mV
mV
mV
mV
mV
mV
µA
µA
mA
V
IN
=
V
IH
(Max)
or V
IL
(Min)
V
IN
=
V
IH
(Min)
or V
IL
(Max)
Guaranteed HIGH Signal
for All Inputs
Guaranteed LOW Signal
for All Inputs
V
IN
=
V
IL
(Min)
V
IN
=
V
IH
(Max)
Inputs OPEN
Conditions
Loading with
50Ω to
−2.0V
Loading with
50Ω to
−2.0V
Note 3:
The specified limits represent the “worst case” value for the parameter. Since these values normally occur at the temperature extremes, additional
noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are cho-
sen to guarantee operation under “worst case” conditions.
3
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