100336
Absolute Maximum Ratings
(Note 2)
Storage Temperature (T
STG
)
Maximum Junction Temperature (T
J
)
V
EE
Pin Potential to Ground Pin
Input Voltage (DC)
Output Current (DC Output HIGH)
ESD (Note 3)
−
65
°
C to
+
150
°
C
+
150
°
C
−
7.0V to
+
0.5V
V
EE
to
+
0.5V
Recommended Operating
Conditions
Case Temperature (T
C
)
Commercial
Industrial
Supply Voltage (V
EE
)
0
°
C to
+
85
°
C
−
40
°
C to
+
85
°
C
−
5.7V to
−
4.2V
−
50 mA
≥
2000V
Note 2:
Absolute maximum ratings are those values beyond which the
device may be damaged or have its useful life impaired. Functional opera-
tion under these conditions is not implied.
Note 3:
ESD testing conforms to MIL-STD-883, Method 3015.
Commercial Version
DC Electrical Characteristics
(Note 4)
V
EE
= −
4.2V to
−
5.7V, V
CC
=
V
CCA
=
GND, T
C
=
0°C to
+85°C
Symbol
Parameter
Min
Typ
V
OH
V
OL
V
OHC
V
OLC
V
IH
V
IL
I
IL
I
IH
I
EE
Output HIGH Voltage
Output LOW Voltage
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
Input LOW Current
Input HIGH Current
Power Supply Current
−165
−1165
−1830
0.50
240
−80
−1025
−1830
−1035
−1610
−870
−1475
−955
−1705
Max
−870
−1620
Units
mV
mV
mV
mV
mV
mV
µA
µA
V
IN
=V
IH (Max)
or V
IL (Min)
V
IN
=
V
IH(Min)
or V
IL (Max)
Guaranteed HIGH Signal
for All Inputs
Guaranteed LOW Signal
for All Inputs
V
IN
=
V
IL
(Min)
V
IN
=
V
IH
(Max)
Inputs Open
Conditions
Loading with
50Ω to
−2.0V
Loading with
50Ω to
−2.0V
Note 4:
The specified limits represent the “worst case” value for the parameter. Since these values normally occur at the temperature extremes, additional
noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are cho-
sen to guarantee operation under “worst case” conditions.
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