100398
Absolute Maximum Ratings
(Note 5)
Storage Temperature (T
STG
)
Maximum Junction Temperature
(T
J
)
V
EE
Pin Potential to Ground Pin
V
TTL
Pin Potential to Ground Pin
ECL Input Voltage (DC)
ECL Output Current
(DC Output HIGH)
TTL Input Voltage (Note 6)
TTL Input Current (Note 6)
Voltage Applied to Output in
HIGH State 3-STATE Output
Current Applied to TTL
Output in LOW State (Max)
ESD (Note 7)
twice the Rated I
OL
(mA)
−
65
°
C to
+
150
°
C
+
150
°
C
−
7.0V to
+
0.5V
−
0.5V to
+
6.0V
V
EE
to
+
0.5V
Recommended Operating
Conditions
Case Temperature (T
C
)
Commercial
Industrial
ECL Supply Voltage (V
EE
)
TTL Supply Voltage (V
TTL
)
0
°
C to
+
85
°
C
−
40
°
C to
+
85
°
C
−
5.7V to
−
4.2V
+
4.5V to
+
5.5V
−
50 mA
−
0.5V to
+
7.0V
−
30 mA to
+
5.0 mA
−
0.5V to
+
5.5V
Note 5:
The “Absolute Maximum Ratings” are those values beyond which
the safety of the device cannot be guaranteed. The device should not be
operated at these limits. The parametric values defined in the Electrical
Characteristics tables are not guaranteed at the absolute maximum rating.
The “Recommended Operating Conditions” table will define the conditions
for actual device operation.
Note 6:
The specified limits represent the “worst case” value for the param-
eter. Since these values normally occur at the temperature extremes, addi-
tional noise immunity and guardbanding can be achieved by decreasing the
allowable system operating ranges. Conditions for testing shown in the
tables are chosen to guarantee operation under “worst case” conditions.
Note 7:
ESD testing conforms to MIL-STD-883, Method 3015.
≥
2000V
Commercial Version
TTL-to-ECL DC Electrical Characteristics
(Note 9)
V
EE
= −
4.2V to
−
5.7V, GND
=
0V, T
C
=
0
°
C to
+
85
°
C, V
TTL
= +4.5V
to
+5.5V
Symbol
Parameter
Min
Typ
Max
V
OH
V
OL
Output HIGH Voltage
Output LOW Voltage
Cutoff Voltage
−1025
−1830
−955
−1705
−2000
−870
−1620
−1950
Units
mV
mV
mV
Conditions
V
IN
=
V
IH(Max)
or V
IL(Min)
Loading with 50Ω to
−
2V
OE and LE LOW, DIR HIGH
V
IN
=
V
IH(Max)
or V
IL
(Min),
Loading with 50Ω to
−2V
V
OHC
V
OLC
V
IH
V
IL
I
IH
I
IL
V
FCD
I
EE
I
EEZ
Output HIGH Voltage
Corner Point High
Output LOW Voltage
Corner Point Low
Input HIGH Voltage
Input LOW Voltage
Input HIGH Current
Breakdown Test
Input LOW Current
Input Clamp
Diode Voltage
V
EE
Supply Current
V
EE
Supply Current
−700
−1.2
−99
−159
−50
−90
2.0
0
−1035
−1610
5.0
0.8
5.0
0.5
mV
mV
V
V
µA
mA
µA
V
mA
mA
V
IN
=
V
IH(Min)
or V
IL(Max)
Loading with 50Ω to
−2V
Over V
TTL
, V
EE
, T
C
Range
Over V
TTL
, V
EE
, T
C
Range
V
IN
= +2.7V
V
IN
= +5.5V
V
IN
= +0.5V
I
IN
= −18
mA
LE LOW, OE and DIR HIGH
Inputs Open
LE and OE LOW, DIR HIGH
Inputs Open
Note 8:
Either voltage limit or current limit is sufficient to protect inputs.
Note 9:
The specified limits represent the “worst case” value for the parameter. Since these values normally occur at the temperature extremes, additional
noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are cho-
sen to guarantee operation under “worst case” conditions.
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