MOC3081, MOC3082, MOC3083
500
I DRM1, PEAK BLOCKING CURRENT (mA)
1.5
1.4
200
IDRM2, NORMALIZED
100
50
1.3
1.2
1.1
1
0.9
0.8
0.7
0.6
5
–40
–20
0
20
40
60
80 100
TA, AMBIENT TEMPERATURE (°C)
–40 –20
0
20
40
60
80 100
TA, AMBIENT TEMPERATURE (°C)
IF = RATED IFT
20
VDRM = 800 V
10
Figure 3. Leakage with LED Off
versus Temperature
25
20
Figure 4. IDRM2, Leakage in Inhibit State
versus Temperature
IFT, NORMALIZED LED TRIGGER CURRENT
1.5
1.4
IFT, NORMALIZED
1.3
1.2
1.1
1
0.9
0.8
0.7
NORMALIZED TO
TA = 25°C
NORMALIZED TO:
PWin 100
µs
q
15
10
5
0
–40
–20
0
20
40
60
TA, AMBIENT TEMPERATURE (°C)
80
100
1
2
5
10
20
PWin, LED TRIGGER PULSE WIDTH (µs)
50
100
Figure 5. Trigger Current versus Temperature
Figure 6. LED Current Required to Trigger
versus LED Pulse Width
+400
Vdc
RTEST
10 kΩ
PULSE
INPUT
CTEST
MERCURY
WETTED
RELAY
X100
SCOPE
PROBE
D.U.T.
1. The mercury wetted relay provides a high speed repeated pulse
to the D.U.T.
2. 100x scope probes are used, to allow high speeds and voltages.
3. The worst–case condition for static dv/dt is established by
triggering the D.U.T. with a normal LED input current, then
removing the current. The variable RTEST allows the dv/dt to be
gradually increased until the D.U.T. continues to trigger in
response to the applied voltage pulse, even after the LED
current has been removed. The dv/dt is then decreased until the
D.U.T. stops triggering.
t
RC is measured at this point and
recorded.
Vmax = 400 V
APPLIED VOLTAGE
WAVEFORM
252 V
dv dt
t
RC
0 VOLTS
V
+
0.63 RCmax
+
504
RC
t
t
Figure 7. Static dv/dt Test Circuit
FAIRCHILD [ FAIRCHILD SEMICONDUCTOR ]
