FXO-LC52
Series
Phase Noise
0 dBc
-10dBc
-20dBc
-30dBc
-40dBc
-50dBc
-60dBc
212.5 MHz
156.25 MHz
2.5V Phase Noise Graph
(dBc / Hz) vs. offset frequency
Data Collected using HP 3048A
Four Frequencies from Jitter Tables
62.5 MHz only to 2 MHz offset Equipment Limitation
-70dBc
-80dBc
-90dBc
-100dBc
-110dBc
-120dBc
-130dBc
-140dBc
-150dBc
-160dBc
62.5 MHz
622.08 MHz
62.5 MHz
622.08 MHz
212.5 MHz
156.25 MHz
10
100
1k
10k
100k
1M
10M
40M
Offset Frequency
(10Hz to 40MHz)
Jitter is frequency dependent. Below are typical values at select frequencies.
LVDS Phase Jitter & Time Interval Error (TIE)
Frequency
62.5 MHz
156.25 MHz
212.5 MHz
622.08MHz
Phase Jitter
(12kHz to 20MHz)
TIE
(Sigma of Jitter Distribution)
Units
pS RMS
pS RMS
pS RMS
pS RMS
2.12
1.04
1.35
1.30
3.1
3.5
4.2
3.7
Phase Jitter
is integrated from HP3048 Phase Noise Measurement System; measured directly into 50 ohm input; V
DD
= 2.5V.
TIE
was measured on LeCroy LC684 Digital Storage Scope, directly into 50 ohm input, with Amherst M1 software; V
DD
= 2.5V.
Per
MJSQ
spec (Methodologies for Jitter and Signal Quality specifications)
LVDS Random & Deterministic Jitter Composition
Frequency
62.5 MHz
156.25 MHz
212.5 MHz
622.08 MHz
Random (Rj)
(pS RMS)
Deterministic (Dj)
(pS P-P)
Total Jitter (Tj)
(14 x Rj) + Dj
27.6 pS
29.2pS
31.2 pS
27.2 pS
1.35
1.40
1.42
1.18
8.4
9.2
10.9
10.4
Rj and Dj
, measured on LeCroy LC684 Digital Storage Scope, directly into 50 ohm input, with Amherst M1 software.
Per
MJSQ
spec (Methodologies for Jitter and Signal Quality specifications)
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