Reliability Test Items
Test
cate-
gories
Test items
1 High temperature
Reverse Bias
Test methods and conditions
Reference
Number Accept-
norms
ance
of
EIAJ ED-4701
sample number
5
(0:1)
(Aug.-2001 edition)
Test Method 101
Test temp.
Bias Voltage
Bias Method
Endurance Tests
Endurance Tests
Test duration
2 High temperature
Bias (for gate)
Test temp.
Bias Voltage
Bias Method
Test duration
3 Temperature
Humidity Bias
Test temp.
Relative humidity
Bias Voltage
Bias Method
Test duration
ON time
OFF time
Test temp.
Number of cycles
: Ta = 125 5
(Tj
150 )
: VC = 0.8×VCES
: Applied DC voltage to C-E
VGE = 0V
: 1000hr.
Test Method 101
5
(0:1)
: Ta = 125 5
(Tj
150 )
: VC = VGE = +20V or -20V
: Applied DC voltage to G-E
VCE = 0V
: 1000hr.
:
:
:
:
:
:
:
:
:
85 2
o
C
85 5%
VC = 0.8×VCES
Applied DC voltage to C-E
VGE = 0V
1000hr.
2 sec.
18 sec.
Tj=100±5 deg
150 , Ta=25±5
Tj
15000 cycles
Test Method 102
Condition code C
5
(0:1)
4 Intermitted
Operating Life
(Power cycle)
( for IGBT )
Test Method 106
5
(0:1)
Failure Criteria
Item
Characteristic
Symbol
Failure criteria
Unit
Lower limit Upper limit
-
-
LSL×0.8
-
-
-
USL×2
USL×2
USL×1.2
USL×1.2
USL×1.2
USL×1.2
mA
A
mA
V
V
mV
mV
-
-
Note
Electrical
Leakage current
ICES
characteristic
±IGES
Gate threshold voltage VGE(th)
Saturation voltage
VCE(sat)
Forward voltage
VF
Thermal
IGBT
VGE
resistance
or VCE
FWD
VF
Isolation voltage
Viso
Visual
Visual inspection
inspection
Peeling
-
Plating
and the others
-
USL×1.2
Broken insulation
The visual sample
LSL : Lower specified limit.
USL : Upper specified limit.
Note : Each parameter measurement read-outs shall be made after stabilizing the components
at room ambient for 2 hours minimum, 24 hours maximum after removal from the tests.
And in case of the wetting tests, for example, moisture resistance tests, each component
shall be made wipe or dry completely before the measurement.
MS5F6137
7
13
FUJI [ FUJI ELECTRIC ]
