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MBM29F040C-70PFTN 参数 Datasheet PDF下载

MBM29F040C-70PFTN图片预览
型号: MBM29F040C-70PFTN
PDF下载: 下载PDF文件 查看货源
内容描述: 4M ( 512K ×8 )位 [4M (512K X 8) BIT]
分类和应用: 内存集成电路光电二极管
文件页数/大小: 40 页 / 411 K
品牌: FUJITSU [ FUJITSU ]
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MBM29F040C-55/-70/-90  
Write Operation Status  
Table 6 Hardware Sequence Flags  
DQ7  
Status  
DQ6  
DQ5  
0
DQ3  
0
DQ2  
1
Embedded Program Algorithm  
Embedded Erase Algorithm  
DQ7  
0
Toggle  
Toggle  
0
1
Toggle  
Erase Suspend Read  
(Erase Suspended Sector)  
1
1
0
Data  
0
0
Data  
0
Toggle  
Data  
In Progress  
Erase  
Erase Suspend Read  
Suspended  
Data  
DQ7  
Data  
(Non-Erase Suspended Sector)  
Mode  
Erase Suspend Program  
Non-Erase Suspended Sector)  
Toggle  
(Note 1)  
1
(Note 2)  
Embedded Program Algorithm  
DQ7  
0
Toggle  
Toggle  
1
1
0
1
1
Program/Erase in Embedded Erase Algorithm  
N/A  
Exceeded  
Time Limits  
Erase  
Erase Suspend Program  
Suspended  
DQ7  
Toggle  
1
0
N/A  
(Non-Erase Suspended Sector)  
Mode  
Notes:1. Performing successive read operations from any address will cause DQ6 to toggle.  
2. Reading the byte address being programmed while in the erase-suspend program mode will indicate logic  
“1” at the DQ2 bit. However, successive reads from the erase-suspended sector will cause DQ2 to toggle.  
3. DQ0 and DQ1 are reserve pins for future use. DQ4 is for Fujitsu internal use only.  
DQ7  
Data Polling  
TheMBM29F040CdevicefeaturesDataPollingasamethodtoindicatetothehostthattheEmbeddedAlgorithms  
areinprogressorcompleted. DuringtheEmbeddedProgramAlgorithmanattempttoreadthedevicewillproduce  
the compliment of the data last written to DQ7. Upon completion of the Embedded Program Algorithm, an attempt  
to read the device will produce the true data last written to DQ7. During the Embedded Erase Algorithm, an  
attempttoreadthedevicewillproducea0attheDQ7 output.UponcompletionoftheEmbeddedEraseAlgorithm  
an attempt to read the device will produce a “1” at the DQ7 output. The flowchart for Data Polling (DQ7) is shown  
in Figure 15.  
For chip erase, and sector erase the Data Polling is valid after the rising edge of the sixth WE pulse in the six  
write pulse sequence. For sector erase, the Data Polling is valid after the last rising edge of the sector erase  
WE pulse. Data Polling must be performed at sector address within any of the sectors being erased and not a  
protected sector. Otherwise, the status may not be valid. Once the Embedded Algorithm operation is close to  
being completed, the MBM29F040C data pins (DQ7) may change asynchronously while the output enable (OE)  
is asserted low. This means that the device is driving status information on DQ7 at one instant of time and then  
that byte’s valid data at the next instant of time. Depending on when the system samples the DQ7 output, it may  
read the status or valid data. Even if the device has completed the Embedded Algorithm operation and DQ7 has  
a valid data, the data outputs on DQ0 to DQ6 may be still invalid. The valid data on DQ0 to DQ7 will be read on  
the successive read attempts.  
The Data Polling feature is only active during the Embedded Programming Algorithm, Embedded Erase  
Algorithm, or sector erase time-out. (See Table 6.)  
See Figure 9 for the Data Polling timing specifications and diagrams.  
15