CA3100
Electrical Specifications
PARAMETER
Wideband Noise Voltage (RTI)
Settling Time (To Within
±50mV
of 9V
Output Swing)
NOTES:
3. Low frequency dynamic characteristic.
Slew Rate
4. Full Power Bandwidth
= --------------------------
.
-
πV
O P
–
P
T
A
= 25
o
C, V
SUPPLY
= ±15V,
Unless Otherwise Specified
(Continued)
SYMBOL
e
N
(Total)
tS
TEST CONDITIONS
BW = 1MHz, R
S
= 1kΩ
R
L
= 2kΩ, C
L
= 20pF
MIN
-
-
TYP
8
0.6
MAX
-
-
UNITS
µV
RMS
µs
Test Circuits
V+
7
0.1µF
V
I
3
V
I
HP606A
OR
EQUIV
8
51Ω
2
+
CA3100
3
6
20pF
4
5
1
0.1µF
V-
WITH V
I
= 0 ADJ
POTENTIO-
METER (R
X
)
TO GIVE
V
O
= 0
±
0.1V
DC
+1V
PULSE
t
R
≤
10ns
t
WIDTH
≥
1µs
51Ω
2kΩ
220Ω
2kΩ
V
O
2
A
OL
=
V
O
V
I
θ
OL
V+
7
0.1µF
+
CA3100
V
O
6
SLOPE = SR
-
-
4
0.1
µF
20
pF
2kΩ
C
C
R
X
SET V
I
TO GIVE
10kΩ
DESIRED V
O
LEVEL
AT TEST FREQUENCY NULL ADJUST
AT FREQUENCY > 1MHz V
I
POTENTIOMETER AND V
O
MEASURED WITH
HF8405A VECTOR
VOLTMETER
V-
FIGURE 1. OPEN-LOOP VOLTAGE GAIN TEST CIRCUIT AND
OFFSET ADJUST CIRCUIT
10pF V+
FIGURE 2. SLEW RATE IN 10X AMPLIFIER TEST CIRCUIT
A
V
= 100
+15V
INPUT REFERRED
NOISE VOLTAGE
e
NO
e
NI
=
100
3
7
0.1µF
+
CA3100
POST AMPL. AND
2 POLE 1MHz
FILTER
1
V
I
3
51Ω
2
+10V
PULSE
t
R
≤
10ns
t
WIDTH
≥
1µs
3
7
+
CA3100
6
0.1µF
SLOPE = SR
V
O
6
-
5
2kΩ
R
S
2
-
4
420Ω
HP400EL
VTVM
500pF
4
0.1µF
47Ω
0.1µF
e
NO
V-
-15V
FIGURE 3. FOLLOWER SLEW RATE TEST CIRCUIT
FIGURE 4. WIDEBAND INPUT NOISE VOLTAGE TEST CIRCUIT
3-3
HARRIS [ HARRIS CORPORATION ]
