HS-1840RH
Burn-In/Life Test Circuits
R
+VS
R
1
2
3
4
5
6
7
8
9
10
11
12
13
14
28
27
26
25
24
23
22
21
20
19
18
17
16
15
R
-VS
+VS
R
1
2
3
4
5
6
7
8
9
10
11
12
13
14
28
27
26
25
24
23
22
21
20
19
18
17
16
15
R
-VS
R
F5
F1
F2
F3
GND
F4
GND
VR
R
DYNAMIC BURN-IN AND LIFE TEST CIRCUIT
NOTES:
VS+ = +15.5V
±0.5V,
VS- = -15.5V
±0.5V
R = 1kΩ
±5%
C1 = C2 = 0.01µF
±10%,
1 each per socket, minimum
D1 = D2 = 1N4002, 1 each per board, minimum
Input Signals: square wave, 50% duty cycle, 0V to 15V peak
±10%
F1 = 100kHz; F2 = F1/2; F3 = F1/4; F4 = F1/8; F5 = F1/16
NOTES:
1. The above test circuits are utilized for all package types.
2. The Dynamic Test Circuit is utilized for all life testing.
NOTES:
STATIC BURN-IN TEST CIRCUIT
R = 1kΩ
±5%,
1
/
4
W
C1 = C2 = 0.01µF minimum, 1 each per socket, minimum
VS+ = 15.5V
±0.5V,
VS- = -15.5V
±0.5V,
VR = 15.5
±0.5V
Irradiation Circuit
HS-1840RH 28 LEAD DIP
+15V
NC
NC
+1V
1
2
3
4
5
6
7
8
9
10
11
12
13
14
28
27
26
25
24
23
22
21
20
19
18
17
16
15
-15V
1KΩ
+5V
NOTE: All irradiation testing is performed in the 28 lead CerDIP package.
Spec Number
8
518022
HARRIS [ HARRIS CORPORATION ]
