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HCPL-5760-600 参数 Datasheet PDF下载

HCPL-5760-600图片预览
型号: HCPL-5760-600
PDF下载: 下载PDF文件 查看货源
内容描述: AC / DC到逻辑接口密封式光电耦合器 [AC/DC to Logic Interface Hermetically Sealed Optocouplers]
分类和应用: 光电
文件页数/大小: 11 页 / 163 K
品牌: HP [ AGILENT(HEWLETT-PACKARD) ]
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AC/DC to Logic Interface
Hermetically Sealed
Optocouplers
Technical Data
HCPL-576X*
5962-8947701
*See matrix for available extensions
Features
• Dual Marked with Device
Part Number and DSCC
Standard Microcircuit
Drawing
• Manufactured and Tested
on a MIL-PRF-38534
Certified Line
• QML-38534, Class H and K
• Hermetically Sealed 8-pin
Dual In-Line Packages
• Performance Guaranteed
over -55
°
C to +125
°
C
• ac or dc Input
• Programmable Sense Voltage
• Hysteresis
• HCPL-3700 Operating
Compatibility
• Logic Compatible Output
• 1500 Vdc Withstand Test
Voltage
• Thresholds Guaranteed over
Temperature
• Thresholds Independent of
LED Characteristics
Applications
• Military and Space
• High Reliability Systems
• Transportation, Medical,
and Life Critical Systems
• Limit Switch Sensing
• Low Voltage Detector
• ac/dc Voltage Sensing
• Relay Contact Monitor
• Relay Coil Voltage Monitor
• Current Sensing
• Microprocessor Interface
• Telephone Ring Detection
• Harsh Industrial
Environments
Description
These devices are single channel,
hermetically sealed, voltage/
current threshold detection
optocouplers. The products are
capable of operation and storage
over the full military temperature
range and can be purchased as
either standard product, or with
full MIL-PRF-38534 Class Level
H or K testing, or from the DSCC
Standard Microcircuit Drawing
(SMD) 5962-89477. All devices
are manufactured and tested on
a MIL-PRF-38534 certified line
and are included in the DSCC
Qualified Manufacturers List,
QML-38534 for Hybrid
Microcircuits.
Schematic
HCPL-5760/1/K
The connection of a 0.1
µ
F bypass capacitor between pins 8 and 5 is recommended.
CAUTION: It is advised that normal static precautions be taken in handling and assembly of this component to
prevent damage and/or degradation which may be induced by ESD.