X25160
EQUIVALENT A.C. LOAD CIRCUIT
5V
1.44KΩ
OUTPUT
1.95KΩ
100pF
1.64KΩ
OUTPUT
4.63KΩ
100pF
3V
A.C. TEST CONDITIONS
Input Pulse Levels
V
CC
x 0.1 to V
CC
x 0.9
Input Rise and Fall Times
10ns
Input and Output Timing Level
V
CC
x 0.5
3064 PGM T11
3064 ILL F09.1
A.C. CHARACTERISTICS
(Over recommended operating conditions, unless otherwise specified)
Data Input Timing
Symbol
f
SCK
t
CYC
t
LEAD
t
LAG
t
WH
t
WL
t
SU
t
H
t
RI(4)
t
FI(4)
t
HD
t
CD
t
CS
t
WC(5)
Data Output Timing
Symbol
f
SCK
t
DIS
t
V
t
HO
t
RO(4)
t
FO(4)
t
LZ(4)
t
HZ(4)
Parameter
Clock Frequency
Output Disable Time
Output Valid from Clock LOW
Output Hold Time
Output Rise Time
Output Fall Time
HOLD
HIGH to Output in Low Z
HOLD
LOW to Output in High Z
Min.
0
Max.
2
250
200
100
100
100
100
Units
MHz
ns
ns
ns
ns
ns
ns
ns
3064 PGM T13.2
Parameter
Clock Frequency
Cycle Time
CS
Lead Time
CS
Lag Time
Clock HIGH Time
Clock LOW Time
Data Setup Time
Data Hold Time
Data In Rise Time
Data In Fall Time
HOLD
Setup Time
HOLD
Hold Time
CS
Deselect Time
Write Cycle Time
Min.
0
500
250
250
200
200
50
50
Max.
2
Units
MHz
ns
ns
ns
ns
ns
ns
ns
µs
µs
ns
ns
µs
ms
3064 PGM T12.2
2
2
100
100
2.0
10
0
2Notes:
(4) This parameter is periodically sampled and not 100% tested.
(5) t
WC
is the time from the rising edge of
CS
after a valid write sequence has been sent to the end of the self-timed internal
nonvolatile write cycle.
9
ICMIC [ IC MICROSYSTEMS ]
