X25642
EQUIVALENT A.C. LOAD CIRCUIT
A.C. CONDITIONS OF TEST
Input Pulse Levels
VCC x 0.1 to VCC x 0.9
10ns
5V
3V
Input Rise and Fall Times
Input and OutputTiming Levels
1.44KΩ
OUTPUT
1.95KΩ
1.64KΩ
OUTPUT
4.63KΩ
VCC X 0.5
7037 FRM T11
100pF
100pF
3132 ILL F09.2
A.C. OPERATING CHARACTERISTICS
Data Input Timing
Symbol
fSCK
tCYC
tLEAD
tLAG
tWH
Parameter
Clock Frequency
Min.
0
Max.
Units
MHz
ns
2
Cycle Time
500
250
250
200
200
50
CS Lead Time
ns
CS Lag Time
ns
Clock HIGH Time
Clock LOW Time
Data Setup Time
Data Hold Time
Data In Rise Time
Data In Fall Time
HOLD Setup Time
HOLD Hold Time
CS Deselect Time
Write Cycle Time
ns
tWL
ns
tSU
ns
tH
50
ns
(4)
tRI
2
2
µs
(4)
tFI
µs
tHD
tCD
tCS
100
100
2.0
ns
ns
µs
(5)
tWC
10
ms
7037 FRM T12
Data Output Timing
Symbol
fSCK
tDIS
Parameter
Min.
Max.
2
Units
MHz
ns
Clock Frequency
0
Output Disable Time
250
200
tV
Output Valid from Clock LOW
Output Hold Time
ns
tHO
0
ns
(4)
tRO
Output Rise Time
100
100
ns
(4)
tFO
Output Fall Time
ns
(4)
tLZ
HOLD HIGH to Output in Low Z
HOLD LOW to Output in High Z
100
100
ns
(4)
tHZ
ns
7037 FRM T13
Notes: (4) This parameter is periodically sampled and not 100% tested.
(5) t is the time from the rising edge of CS after a valid write sequence has been sent to the end of the self-timed internal nonvolatile
WC
write cycle.
9
ICMIC [ IC MICROSYSTEMS ]
