IDT7025S/L
HIGH-SPEED 8K x 16 DUAL-PORT STATIC RAM
MILITARY AND COMMERCIAL TEMPERATURE RANGES
5V
5V
1250Ω
DATA
OUT
1250Ω
DATA
OUT
775Ω
30pF
775Ω
5pF
AC TEST CONDITIONS
Input Pulse Levels
Input Rise/Fall Times
Input Timing Reference Levels
Output Reference Levels
Output Load
GND to 3.0V
5ns Max.
1.5V
1.5V
Figures 1 and 2
2683 tbl 12
BUSY
INT
2683 drw 06
Figure 1. AC Output Test Load
Figure 2. Output Test Load
( for t
LZ
, t
HZ
, t
WZ
, t
OW
)
*
including scope and jig.
AC ELECTRICAL CHARACTERISTICS OVER THE
OPERATING TEMPERATURE AND SUPPLY VOLTAGE RANGE
(4)
Symbol
READ CYCLE
t
RC
t
AA
t
ACE
t
ABE
t
AOE
t
OH
t
LZ
t
HZ
t
PU
t
PD
t
SOP
t
SAA
Read Cycle Time
Address Access Time
Chip Enable Access Time
(3)
Byte Enable Access Time
(3)
Output Enable Access Time
Output Hold from Address Change
Output Low-Z Time
(1, 2)
Output High-Z Time
(1, 2)
Chip Enable to Power Up Time
(1,2)
(1,2)
Parameter
IDT7025X15
Com'l. Only
Min. Max.
15
—
—
—
—
3
3
—
0
—
10
—
—
15
15
15
10
—
—
10
—
15
—
15
IDT7025X17
Com'l. Only
Min.
Max.
17
—
—
—
—
3
3
—
0
—
10
—
—
17
17
17
10
—
—
10
—
17
—
17
IDT7025X20
Min.
20
—
—
—
—
3
3
—
0
—
10
—
Max.
—
20
20
20
12
—
—
12
—
20
—
20
IDT7025X25
Min.
25
—
—
—
—
3
3
—
0
—
10
—
Max.
—
25
25
25
13
—
—
15
—
25
—
25
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Chip Disable to Power Down Time
Semaphore Address Access
(3)
Semaphore Flag Update Pulse (
OE
or
SEM
)
IDT7025X35
Symbol
READ CYCLE
t
RC
t
AA
t
ACE
t
ABE
t
AOE
t
OH
t
LZ
t
HZ
t
PU
t
PD
t
SOP
t
SAA
Read Cycle Time
Address Access Time
Chip Enable Access Time
(3)
Byte Enable Access Time
(3)
Output Enable Access Time
Output Hold from Address Change
Output Low-Z Time
(1, 2)
Output High-Z Time
(1, 2)
Chip Enable to Power Up Time
(1,2)
(1,2)
IDT7025X55
Min.
55
—
—
—
—
3
3
—
0
—
15
—
Max.
—
55
55
55
30
—
—
25
—
50
—
55
Parameter
Min.
35
—
—
—
—
3
3
—
0
—
15
—
Max.
—
35
35
35
20
—
—
15
—
35
—
35
IDT7025X70
Mil. Only
Min.
Max.
70
—
—
—
—
3
3
—
0
—
15
—
—
70
70
70
35
—
—
30
—
50
—
70
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
2683 tbl 13
Chip Disable to Power Down Time
Semaphore Address Access Time
Semaphore Flag Update Pulse (
OE
or
SEM
)
(3)
NOTES:
1. Transition is measured
±500mV
from Low or High-impedance voltage with Output Test Load (Figure 2).
2. This parameter is guaranteed by device characterization, but is not production tested.
3. To access RAM,
CE
= V
IL,
UB
or
LB
= V
IL, and
SEM
= V
IH.
To access semephore,
CE
= V
IH or
UB
&
LB
= V
IH, and
4. "X" in part numbers indicates power rating (S or L).
6.16
SEM
= V
IL.
7
IDT [ INTEGRATED DEVICE TECHNOLOGY ]
