IDT70V261S/L
High-Speed 16K x 16 Dual-Port Static RAM with Interrupt
Industrial and Commercial Temperature Ranges
3.3V
3.3V
590
Ω
DATA
OUT
435Ω
30pF
435Ω
5pF*
AC Test Conditions
Input Pulse Levels
Input Rise/Fall Times
Input Timing Reference Levels
Output Reference Levels
Output Load
GND to 3.0V
3ns Max.
1.5V
1.5V
Figures 1 and 2
3040 tbl 10
590Ω
DATA
OUT
BUSY
INT
3040 drw 03
3040 drw 04
Figure 1. AC Output Test Load
Figure 2. Output Test Load
(for t
LZ
, t
HZ
, t
WZ
, t
OW
)
* Including scope and jig.
Timing of Power-Up Power-Down
CE
t
PU
I
CC
I
SB
t
PD
3040 drw 05
,
AC Electrical Characteristics Over the
Operating Temperature and Supply Voltage Range
(4)
70V261X25
Com'l
& Ind
Symbol
READ CYCLE
t
RC
t
AA
t
ACE
t
ABE
t
AOE
t
OH
t
LZ
t
HZ
t
PU
t
PD
t
SOP
t
SAA
Read Cycle Time
Address Access Time
Chip Enable Access Time
(3)
Byte Enable Access Time
(3)
Output Enable Access Time
Output Hold from Address Change
Output Low-Z Time
(1,2)
Output High-Z Time
(1,2)
Chip Enable to Power Up Time
(2)
Chip Disable to Power Down Time
(2)
Semaphore Flag Update Pulse (OE or
SEM)
Semaphore Address Access Time
25
____
____
____
____
70V261X35
Com'l Only
Min.
Max.
70V261X55
Com'l Only
Min.
Max.
Unit
Parameter
Min.
Max.
35
____
____
____
____
55
____
____
____
____
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
3040 tbl 11
25
25
25
15
____
____
35
35
35
20
____
____
55
55
55
30
____
____
____
____
____
3
3
____
3
3
____
3
3
____
15
____
20
____
25
____
0
____
0
____
0
____
25
____
35
____
50
____
15
____
15
____
15
____
35
45
65
NOTES:
1. Transition is measured 0mV from Low- or High-impedance voltage with Output Test Load (Figure 2).
2. This parameter is guaranteed by device characterization, but is not production tested.
3. To access RAM,
CE
= V
IL
and
SEM
= V
IH
. To access semaphore,
CE
= V
IH
and
SEM
= V
IL
.
4. 'X' in part number indicates power rating (S or L).
6.42
6
IDT [ INTEGRATED DEVICE TECHNOLOGY ]
