IDT71256SA
CMOS Static RAM 256K (32K x 8-Bit)
Commercial and Industrial Temperature Ranges
DC Electrical Characteristics
(V
CC
= 5.0V ± 10%)
Symbol
|I
LI
|
|I
LO
|
V
OL
V
OH
IDT71256SA
Parameter
Input Leakage Current
Output Leakage Current
Output Low Voltage
Output High Voltage
Test Conditions
V
CC
= Max., V
IN =
GND to V
CC
V
CC
= Max.,
CS
= V
IH
, V
OUT
= GND to V
CC
I
OL
= 8mA, V
CC
= Min.
I
OH
= -4mA, V
CC
= Min.
Min.
___
___
Max.
5
5
0.4
___
Unit
µA
µA
V
V
2948 tbl 05
___
2.4
DC Electrical Characteristics
(1)
Symbol
I
CC
I
SB
I
SB1
Parameter
Dynamic Operating Current
CS
< V
IL
, Outputs Open, V
CC
= Max., f = f
MAX
(2)
Standby Power Supply Current (TTL Level)
CS
> V
IH
, Outputs Open, V
CC
= Max., f = f
MAX
(2)
Standby Power Supply Current (CMOS Level)
CS
> V
HC
, Outputs Open, V
CC
= Max., f = 0
(2)
,
V
IN
< V
LC
or V
IN
> V
HC
(V
CC
= 5.0V ± 10%, V
LC
= 0.2V, V
HC
= V
CC
–0.2V)
71256SA12
160
50
15
71256SA15
150
40
15
71256SA20
145
40
15
71256SA25
145
40
15
Unit
mA
mA
mA
NOTES:
1. All values are maximum guaranteed values.
2. f
MAX
= 1/t
RC
(all address inputs are cycling at f
MAX
); f = 0 means no address input lines are changing.
2948 tbl 06
AC Test Conditions
Input Pulse Levels
Input Rise/Fall Times
Input Timing Reference Levels
Output Reference Levels
AC Test Load
GND to 3.0V
3ns
1.5V
1.5V
See Figures 1 and 2
2948 tbl 07
(T
A
= +25°C, f = 1.0MHz, SOJ package)
Symbol
C
IN
C
I/O
Parameter
(1)
Input Capacitance
I/O Capacitance
Conditions
V
IN
= 3dV
V
OUT
= 3dV
Max.
7
7
Unit
pF
pF
2948 tbl 08
Capacitance
NOTE:
1. This parameter is guaranteed by device characterization, but not production
tested.
5V
480Ω
DATA
OUT
30pF*
255Ω
2948 drw 03
5V
480Ω
DATA
OUT
5pF*
255Ω
,
.
2948 drw 04
Figure 1. AC Test Load
*Including jig and scope capacitance.
Figure 2. AC Test Load
(for t
CLZ
, t
OLZ
, t
CHZ
, t
OHZ
, t
OW,
and t
WHZ
)
6.42
3
IDT [ INTEGRATED DEVICE TECHNOLOGY ]
