72801/72811/72821/72831/72841 DUAL CMOS SyncFIFO™
256 x 9, 512 x 9, 1024 x 9, 2048 x 9 and 4096 x 9
COMMERCIAL TEMPERATURE
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol Rating
Terminal Voltage with
V
TERM
Respect to GND
Operating Temperature
T
A
Temperature Under Bias
T
BIAS
T
STG
I
OUT
Storage Temperature
DC Output Current
Commercial
–0.5 to +7.0
0 to +70
–55 to +125
–55 to +125
50
Unit
V
°C
°C
°C
mA
3034 tbl 02
RECOMMENDED OPERATING CONDITIONS
Symbol
V
CC
GND
V
IH
V
IL
Parameter
Supply Voltage
Supply Voltage
Input High Voltage
Input Low Voltage
Min.
4.5
0
2.0
—
Typ.
5.0
0
—
—
Max.
5.5
0
—
0.8
Unit
V
V
V
V
3034 tbl 03
NOTE:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS
may cause permanent damage to the device. This is a stress rating only
and functional operation of the device at these or any other conditions
above those indicated in the operational sections of the specification is not
implied. Exposure to absolute maximum rating conditions for extended
periods may affect reliability.
CAPACITANCE
(T
A
= +25°C, f = 1.0MHz)
Symbol
C
IN
(2)
Parameter
Input Capacitance
Output Capacitance
Conditions
V
IN
= 0V
V
OUT
= 0V
Max.
10
10
Unit
pF
pF
3034 tbl 04
C
OUT
(1,2)
NOTE:
1. With output deselected (
OEA
,
OEB
= HIGH).
DC ELECTRICAL CHARACTERISTICS
(Commercial: V
CC
= 5V
±
10%, T
A
= 0°C to +70°C)
IDT72801
IDT72811
Commercial
t
CLK
= 15, 20, 25, 35ns
Typ.
—
—
—
—
—
Symbol
I
LI
(1)
I
LO
(2)
V
OH
V
OL
I
CC
(3)
Parameter
Input Leakage Current (Any Input)
Output Leakage Current
Output Logic “1” Voltage, I
OH
= –2 mA
Output Logic “0” Voltage, I
OL
= 8 mA
Active Power Supply Current
Min.
–1
–10
2.4
—
—
Max.
–1
10
—
0.4
270
Unit
µA
µA
V
V
mA
3034 tbl 05
IDT72821
IDT72831
IDT72841
Commercial
t
CLK
= 20, 25, 35 ns
Typ.
—
—
—
—
—
Symbol
I
LI
(1)
I
LO
(2)
V
OH
V
OL
I
CC
(3)
Parameter
Input Leakage Current (Any Input)
Output Leakage Current
Output Logic “1” Voltage, I
OH
= –2 mA
Output Logic “0” Voltage, I
OL
= 8 mA
Active Power Supply Current
Min.
–1
–10
2.4
—
—
Max.
–1
10
—
0.4
300
Unit
µA
µA
V
V
mA
3034 tbl 06
NOTES:
1. Measurements with 0.4
≤
VIN
≤
VCC.
2. OEA, OEB
≥
VIH, 0.4
≤
VOUT
≤
VCC.
3. Measurements are made with outputs open. Tested at f
CLK
= 20MHz.
Icc limits applicable when using both banks of FIFOs simultaneously.
5.15
4
IDT [ INTEGRATED DEVICE TECHNOLOGY ]
