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E28F010-90 参数 Datasheet PDF下载

E28F010-90图片预览
型号: E28F010-90
PDF下载: 下载PDF文件 查看货源
内容描述: 1024K ( 128K ×8 )的CMOS FLASH MEMORY [1024K (128K x 8) CMOS FLASH MEMORY]
分类和应用:
文件页数/大小: 30 页 / 407 K
品牌: INTEL [ INTEL CORPORATION ]
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28F010
1024K (128K x 8) CMOS FLASH MEMORY
Y
Flash Electrical Chip-Erase
1 Second Typical Chip-Erase
Quick Pulse Programming Algorithm
10
ms
Typical Byte-Program
2 Second Chip-Program
100 000 Erase Program Cycles
12 0V
g
5% V
PP
High-Performance Read
65 ns Maximum Access Time
CMOS Low Power Consumption
10 mA Typical Active Current
50
mA
Typical Standby Current
0 Watts Data Retention Power
Integrated Program Erase Stop Timer
Y
Y
Command Register Architecture for
Microprocessor Microcontroller
Compatible Write Interface
Noise Immunity Features
g
10% V
CC
Tolerance
Maximum Latch-Up Immunity
through EPI Processing
ETOX
TM
Nonvolatile Flash Technology
EPROM-Compatible Process Base
High-Volume Manufacturing
Experience
JEDEC-Standard Pinouts
32-Pin Plastic Dip
32-Lead PLCC
32-Lead TSOP
(See Packaging Spec Order
231369)
Y
Y
Y
Y
Y
Y
Y
Y
Y
Extended Temperature Options
Intel’s 28F010 CMOS flash memory offers the most cost-effective and reliable alternative for read write
random access nonvolatile memory The 28F010 adds electrical chip-erasure and reprogramming to familiar
EPROM technology Memory contents can be rewritten in a test socket in a PROM-programmer socket on-
board during subassembly test in-system during final test and in-system after-sale The 28F010 increases
memory flexibility while contributing to time and cost savings
The 28F010 is a 1024 kilobit nonvolatile memory organized as 131 072 bytes of 8 bits Intel’s 28F010 is
offered in 32-pin plastic dip or 32-lead PLCC and TSOP packages Pin assignments conform to JEDEC
standards for byte-wide EPROMs
Extended erase and program cycling capability is designed into Intel’s ETOX (EPROM Tunnel Oxide) process
technology Advanced oxide processing an optimized tunneling structure and lower electric field combine to
extend reliable cycling beyond that of traditional EEPROMs With the 12 0V V
PP
supply the 28F010 performs
100 000 erase and program cycles well within the time limits of the Quick Pulse Programming and Quick Erase
algorithms
Intel’s 28F010 employs advanced CMOS circuitry for systems requiring high-performance access speeds low
power consumption and immunity to noise Its 65 nanosecond access time provides no-WAIT-state perform-
ance for a wide range of microprocessors and microcontrollers Maximum standby current of 100
mA
trans-
lates into power savings when the device is deselected Finally the highest degree of latch-up protection is
achieved through Intel’s unique EPI processing Prevention of latch-up is provided for stresses up to 100 mA
on address and data pins from
b
1V to V
CC
a
1V
With Intel’s ETOX process base the 28F010 builds on years of EPROM experience to yield the highest levels
of quality reliability and cost-effectiveness
Other brands and names are the property of their respective owners
Information in this document is provided in connection with Intel products Intel assumes no liability whatsoever including infringement of any patent or
copyright for sale and use of Intel products except as provided in Intel’s Terms and Conditions of Sale for such products Intel retains the right to make
changes to these specifications at any time without notice Microcomputer Products may have minor variations to this specification known as errata
COPYRIGHT
INTEL CORPORATION 1995
November 1995
Order Number 290207-010