Specifications HS-3374RH
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
LIMITS
GROUP A SUB-
PARAMETER
SYMBOL
GROUPS
TEMPERATURE
MIN
MAX
UNITS
o
o
o
Propagation Delay Time TTL/CMOS
Enable to CMOS Out
TPZLTC
9, 10, 11
-55 C, +25 C, +125 C
-
-
-
-
-
90
ns
o
o
o
Propagation Delay Time CMOS/TTL
Disable to TTL Out
TPHZCT
TPZHCT
TPLZCT
TPZLCT
9, 10, 11
9, 10, 11
9, 10, 11
9, 10, 11
-55 C, +25 C, +125 C
70
ns
ns
ns
ns
o
o
o
Propagation Delay Time CMOS/TTL
Disable to TTL Out
-55 C, +25 C, +125 C
130
120
125
o
o
o
Propagation Delay Time CMOS/TTL
Disable to TTL Out
-55 C, +25 C, +125 C
o
o
o
Propagation Delay Time CMOS/TTL
Disable to TTL Out
-55 C, +25 C, +125 C
NOTE: Timings are measured with the following conditions: CL = 100pF, VDD = 9.5V, VCC = 4.75V, VIH = 8.5V (2.8V), VIL = 1.0V (0.8V).
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
LIMITS
PARAMETER
SYMBOL
CONDITIONS
TEMPERATURE
MIN
MAX
UNITS
o
Input, Output Capacitance
CMOS
CI/O
VDD = Open, f = 1MHz, All Measure-
ments Referenced to Device Ground
+25 C
-
13
pF
o
Input Capacitance
CIN
VDD = Open, f = 1MHz, All Measure-
ments Referenced to Device Ground
+25 C
-
-
15
17
pF
pF
o
Input, Output Capcitance
TTL
CI/O
VDD = Open, f = 1MHz, All Measure-
ments Referenced to Device Ground
+25 C
NOTE: The parameters listed in Table 3 are controlled via design or process parameters and are not directly tested. These parameters
are characterized upon initial design release and upon design changes which would affect these characteristics.
Spec Number 518052
4
INTERSIL [ Intersil ]
