SEMICONDUCTOR
MARKING SPECIFICATION
KTN2907AU
USM PACKAGE
1. Marking method
Laser Marking
2. Marking
1
ZH
Marking
ZH
-
01
0 1
-
4
(D)
D
(4)
5
(E)
E
(5)
6
(F)
F
(6)
Periode (Year)
52
5B
E2
EB
2006-2010-2014...
2007-2011-2015...
2
No.
Item
Device Mark
hFE Grade
* Lot No.
Description
KTN2907AU
2006. 1st Week
[0:1st Character, 1:2nd Character]
Note) * Lot No. marking method
Character
arrangement
Year
1 st Character
2nd Character
1
(A)
A
(1)
2
(B)
B
(2)
3
(C)
C
(3)
7
(G)
G
(7)
8
(H)
H
(8)
9
(I)
I
(9)
Remark
0
(J)
J
(0)
Marking (Week)
01
0A
J1
JA
02
0B
J2
JB
51
5A
E1
EA
1 st Year (2006)
2 nd Year (2007)
4 rd Year (2008)
4 th Year (2009)
Rotation for 4 years
2008-2012-2016...
2009-2013-2017...
2008. 8. 29
Revision No : 1
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KEC [ KEC(KOREA ELECTRONICS) ]
