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Email: info@kingtronics.com
Tel: (852) 8106 7033
Fax: (852) 8106 7099
LKT
Low Voltage Multilayer Chip Ceramic
Capacitor
Specification and Test Condition:
1. Appearance
Dielectrics
NPO/X7R/X5R/Y5V
2. Dimensions
Dielectrics
NPO/X7R/X5R/Y5V
3. Capacitance
Dielectrics
NPO
Specification
No defects or abnormalities
Testing Condition
Visual inspection
Specification
Within the specified dimensions
Testing Condition
Using calipers on micrometer
Specification
Within the specified tolerance
B:±0.1pF;C:±0.25pF;D:±0.5pF;J: ±5%
Within the specified tolerance
J: ±5%；K: ±10%； M: ±20%
Within the specified tolerance
M: ±20%; Z: +80% ~ -20%
Testing Condition
1.0±0.2Vrms, 1MHz±10%
(C>1000 pF, 1.0±0.2Vrms, 1KHz±10%，)
25℃
1.0±0.2Vrms, 1KHz±10%
（Cp＞10uF,0.5±0.1Vrms,120±24Hz）
at 25
℃
,48hrs after annealing
1.0±0.2Vrms, 1KHz±10%
（Cp＞10uF,0.5±0.1Vrms,120±24Hz）
at 25℃, 48hrs after annealing
X7R/X5R
Y5V
4. Dissipation Factor
Dielectrics
NPO
X7R/X5R
Y5V
Specification
Cp<30pF, Q≥400+20Cp;
Cp≥30pF, Q≥1000
V
R
≥25V,
DF
≤2.5%
V
R
=16V, DF
≤3.5%
V
R
≤10V,
DF
≤5.0%
V
R
≥25V,
DF
≤7.0%
(C<1.0μF)
DF
≤9.0%
(C≥1.0μF)
V
R
=16V, DF
≤9.0%
V
R
≤10V,
DF
≤12.5%
Testing Condition
1.0±0.2Vrms,1MHz±10% ,25℃
(Cp>1000pF,1.0±0.2Vrms,1KHz±10%)
1.0±0.2Vrms, 1KHz±10%,
(Cp＞10uF,0.5±0.1Vrms,120±24Hz)
at 25℃,48hrs after annealing
1.0±0.2Vrms, 1KHz±10%,
(Cp＞10uF,0.5±0.1Vrms,120±24Hz)
at 25℃,48hrs after annealing
5. Insulation Resistance
Dielectrics
NPO/X7R/
X5R/Y5V
6. Dielectric Strength
Dielectrics
NPO /X7R/X5R/Y5V
Specification
More than 10 GΩ or 500Ω·F, whichever is
smaller.
Testing Condition
Rated voltage for 60±5sec, at 25℃
Specification
No defects or abnormalities.
Testing Condition
No failure shall be observed when 300% (NPO);250%
(X7R/ X5R/Y5V)of the rated voltage is applied between
terminations for 1 to 5 seconds, provided the charge
/discharge current is less than 500mA
3
KINGTRONICS [ Kingtronics International Company ]
