Website: www.kingtronics.com
Email: info@kingtronics.com
Tel: (852) 8106 7033
Fax: (852) 8106 7099
LKT
Low Voltage Multilayer Chip Ceramic
Capacitor
11. Bending
Dielectrics
NPO
Specification
No remarkable visual damage
Cp change
≤
±5% or
≤
0.5 pF
No remarkable visual damage
Cp change
≤
±12.5%
Testing Condition
Solder the capacitor on testing substrate and put it on
testing stand. The middle part of substrate shall
successively be pressurized by pressuring rod at a rated of
about 1.0mm/sec. Until the deflection become means of the
1.0mm.
X7R/X5R
Y5V
No remarkable visual damage
Cp change
≤
±30%
12. Resistance to Soldering Heat
Dielectrics
Specification
No remarkable visual damage
Cp change within ±2.5% or ±0.25pF,
NPO
whichever is larger.
DF meets initial standard value.
IR meets initial standard value.
No remarkable visual damage
Cp change within ±5%
X7R/X5R
DF meets initial standard value.
IR meets initial standard value.
No remarkable visual damage
Cp change within ±20%
Y5V
DF meets initial standard value.
IR meets initial standard value.
13. Temperature Cycle
Dielectrics
Testing Condition
Soldering temperature: 270±5℃
Preheating: 120~150
℃
60sec.
Dipping time: 10±1 seconds.
Measurement to be made after being kept at room
temperature for 24±2 (COG) or 48±4(X7R ,X5R, Y5V)
hours.
Recovery for the following period under the standard
condition after test.
*Initial measurement for high dielectric constant type
Perform a heat treatment at 140~150
℃
for 1hr and let sit
for 48±4hrs at room temperature. Perform the initial
measurement.
Specification
No remarkable visual damage
Cp change within ±2.5% or ±0.25pF,
whichever is larger.
NPO
X7R/X5R
No remarkable visual damage
Cp change within ±7.5%
Testing Condition
To perform 5 cycles of the stated environment:
Step
Temperature
Time
1
Min. operating Temp.+0/-3℃
30min
2
25℃
2~3 min
3
Max. operating Temp.+0/-3℃
30 min
4
25℃
2~3 min
Measurement to be made after being kept at room
temperature for 24±2hrs (COG) or 48±4hrs (X7R, X5R,
Y5V) at room temperature, then measure.
*Initial measurement for high dielectric constant type
Perform a heat treatment at 140~150℃ for 1hr and let sit
for 48±4hrs at room temperature.
Perform the initial measurement.
5
KINGTRONICS [ Kingtronics International Company ]
