KC
three-terminal inductor/capacitor
environmental applications
(continued)
Performance Characteristics
Parameter
Capacitance vs.
Temperature
Characteristics
Requirement
Variation rate of capacitance in operate
temperature are shown below:
Part:
KC2AT120N6NSL
KC2AT180N13NL
KC2AT350N15NL
KC2BTTE100N11NL
KC2BTTE200M17NL
KC2BTTE450M37NL
KC2BTTE850M37NL
KC2BTTE191M37NL
KC2BTTE341M67NL
No physical damage
Rate:
±10%
±10%
±10%
±5%
±5%
±5%
±5%
±10%
±10%
Test Method
The capacitance shall be measured at each stage
below. The rate shall be calculated against the
capacitance measured at 20°C.
Step:
1
2
3
4
Temperature:
20°C
-40°C ± 3°C
20°C
85°C ± 3°C
Terminal Adhesion Strength
Solder a chip to a test
substrate and then
laterally apply a
load (5N, 500gF) in
the arrow direction
Force
Direction
Substrate
Chip
Resistance to Solder Heat
Appearance: No physical damage
Capacitance: Within tolerance
Dielectric Loss: Within tolerance
Insulation Resistance: Within tolerance
Withstand Voltage: No abnormality
More than 95% of the terminal electrode
shall be covered with new solder
Flux: 25% rosin
Preheating: 120 to 180 seconds
Preheating Temperature: 150°C to 200°C (1J, 2AF, 2B)
Solder: H60A
Solder Temperature: 260°C ±5°C
Dip Time: 5 seconds ± 0.5 second
Flux: 25% rosin
Solder: H60A
Solder Temperature: 235°C ±5°C
Dip Time: 2 seconds ± 0.5 second
Repeat the following heat cycle 10 times:
Step:
1
2
3
4
Temperature:
-40°C ± 3°C
Room Temp.
85°C ± 2°C
Room Temp.
Time:
30 minutes
15 minutes
30 minutes
15 minutes
± 3 minutes
maximum
± 3 minutes
maximum
Solderability
Temperature Cycle*
Appearance: No physical damage
Capacitance: Within tolerance
Dielectric Loss: Within tolerance
Insulation Resistance: Within tolerance
Withstand Voltage: No abnormality
High Temperature
Resistance*
Appearance: No physical damage
Capacitance: Within tolerance
Dielectric Loss: Within tolerance
Insulation Resistance: Within tolerance
Withstand Voltage: No abnormality
Appearance: No physical damage
Capacitance: Within tolerance
Dielectric Loss: Within tolerance
Insulation Resistance: Within tolerance
Appearance: No physical damage
Capacitance: Within tolerance
Temperature: 70°C ± 2°C
Bias: DC25V (2AF, 2A, 2B), DC16V (1J)
Bias: DC200mA
Test Time: 500 hours
Temperature: 85°C ± 2°C
Humidity: 85% ± 5%
Test Time: 500 hours
After soldering a chip
to a test substrate,
Substrate
bend the substrate
by 1 mm and then
measure. The substrate
is GE4 or based on GE4.
45
±
2
Temperature: 40°C ± 2°C
Humidity: 90 - 95%
Bias: DC25V
Bias: DC200mA
Test Time: 500 hours
20
Humidity Resistance
(Unload)*
Substrate Bending Test
Weight
Displacement
45
±
2
Humidity Resistance
(Load)*
Appearance: No physical damage
Capacitance: Within tolerance
Dielectric Loss: Within tolerance
Insulation Resistance: Within tolerance
* After temperature cycle test, high temperature resistance test or humidity resistance test, the tested sample should be measured
after having been left in temperature from 15°C to 35°C and relative humidity from 20% to 90% for 24 hours.
Specifications given herein may be changed at any time without prior notice. Please confirm technical specifications before you order and/or use.
3/12/07
KOA Speer Electronics, Inc.
• Bolivar Drive • P Box 547 • Bradford, PA 16701 • USA • 814-362-5536 • Fax: 814-362-8883 • www.koaspeer.com
.O.
281
EMI/EMC
filtering
KOA [ KOA SPEER ELECTRONICS, INC. ]
